Performance evaluation of texture measures with classification based on Kullback discrimination of distributions

This paper evaluates the performance both of some texture measures which have been successfully used in various applications and of some new promising approaches. For classification a method based on Kullback discrimination of sample and prototype distributions is used. The classification results fo...

Full description

Saved in:
Bibliographic Details
Published inPattern Recognition, 1994 12th International Conference On. Vol. 1 Vol. 1; pp. 582 - 585 vol.1
Main Authors Ojala, T., Pietikainen, M., Harwood, D.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1994
Subjects
Online AccessGet full text
ISBN0818662654
9780818662652
DOI10.1109/ICPR.1994.576366

Cover

Abstract This paper evaluates the performance both of some texture measures which have been successfully used in various applications and of some new promising approaches. For classification a method based on Kullback discrimination of sample and prototype distributions is used. The classification results for single features with one-dimensional feature value distributions and for pairs of complementary features with two-dimensional distributions are presented.
AbstractList This paper evaluates the performance both of some texture measures which have been successfully used in various applications and of some new promising approaches. For classification a method based on Kullback discrimination of sample and prototype distributions is used. The classification results for single features with one-dimensional feature value distributions and for pairs of complementary features with two-dimensional distributions are presented.
Author Pietikainen, M.
Harwood, D.
Ojala, T.
Author_xml – sequence: 1
  givenname: T.
  surname: Ojala
  fullname: Ojala, T.
  organization: Dept. of Electr. Eng., Oulu Univ., Finland
– sequence: 2
  givenname: M.
  surname: Pietikainen
  fullname: Pietikainen, M.
– sequence: 3
  givenname: D.
  surname: Harwood
  fullname: Harwood, D.
BookMark eNo9kFtLxDAQhQMq6K77Lj7lD7Smba6PUrwsLriIPi-TdILRXpam9fLvjaw4L2fOx3AYzoIc90OPhFwULC8KZq7W9fYpL4zhuVCykvKILJgutJSlFPyUrGJ8Y2mESEidkf0WRz-MHfQOKX5AO8MUhp4Onk74Nc0j0g4hJo30M0yv1LUQY_DBHe4sRGxoWh7mtrXg3mkTohtDF_r_oESmMdj518dzcuKhjbj60yV5ub15ru-zzePdur7eZKFQfMpAGS4ANICRqmTacttwIY1ijW44SO65d0ybBitrrdZKCeTCObScl1abakkuD7kBEXf79BGM37tDJ9UPZDdc0w
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/ICPR.1994.576366
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Xplore POP ALL
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
EndPage 585 vol.1
ExternalDocumentID 576366
GroupedDBID 6IE
6IK
6IL
AAJGR
AAWTH
ACGHX
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
OCL
RIB
RIC
RIE
RIL
ID FETCH-LOGICAL-i174t-a7945aa8aa967208b4bd456970d8d4a64f4fc089de3bbb88775e45cceb442b893
IEDL.DBID RIE
ISBN 0818662654
9780818662652
IngestDate Tue Aug 26 23:10:04 EDT 2025
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i174t-a7945aa8aa967208b4bd456970d8d4a64f4fc089de3bbb88775e45cceb442b893
ParticipantIDs ieee_primary_576366
PublicationCentury 1900
PublicationDate 19940000
PublicationDateYYYYMMDD 1994-01-01
PublicationDate_xml – year: 1994
  text: 19940000
PublicationDecade 1990
PublicationTitle Pattern Recognition, 1994 12th International Conference On. Vol. 1
PublicationTitleAbbrev ICPR
PublicationYear 1994
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0000558667
Score 1.8208885
Snippet This paper evaluates the performance both of some texture measures which have been successfully used in various applications and of some new promising...
SourceID ieee
SourceType Publisher
StartPage 582
SubjectTerms Analysis of variance
Autocorrelation
Automation
Distributed computing
Electric variables measurement
Histograms
Image texture analysis
Performance evaluation
Prototypes
Rotation measurement
Title Performance evaluation of texture measures with classification based on Kullback discrimination of distributions
URI https://ieeexplore.ieee.org/document/576366
Volume 1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV09a8MwEBVNpk79Suk3GrraNfZJtubQkLZQTGkgW5BOMpTQJCT20l9fneUktHToJhkjjDjr7p7uvWPsHlOUxoosyrR0EUhQkal84mpSRO_RFBkCVVu8yvEEnqdi2ulst1wY51xbfOZiGrZ3-XaJDUFlPnmXmZQ91vNWFqhaOzglEaKQMm8VHknDLZUCOn2d7Tzd3lIm6uFpWL4RUQ_isOaP3iqtaxkdBc72plUkpIqSedzUJsavX3qN__zqYzbYc_h4ufNOJ-zALc7YqtzzBPhe6JsvK04VIM3a8c8AGm44IbQcKbimaqLwHvk8y_3gxWeuRuOcE6s3dAbbLmRJirfrorUZsMno8X04jrqeC9GHz03qSPv_U2hdaK1kniaFAWN9jKXyxBYWtIQKKkwKZV1mjPEnVC4cCERnAFLjg59z1l8sF-6C8YogrsSHVzZHwNQWIKwstMitQcxBXbJT2qzZKshqzMI-Xf359JodBhFjwj5uWL9eN-7WRwO1uWvt4BsVH7Rk
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV09T8MwELWgDDDxVcQ3HlgTovTsJHNF1dJSVaiVulX22ZFQRVu1ycKvxxenVCAGNieKrMhy8u6e771j7BFjlNqIVtBS0gYgIQt07hJXHSM6RMtoI1C1xVB2J_AyFdPaZ7vSwlhrq-IzG9KwOss3SyyJKnPJu2xJuc8OHOyD8GKtb0IlEiKVMqk8HsnFLZYCaoed7XW8PaeMsqdee_RGUj0I_aw_uqtU4NI59qrtTeVJSDUl87AsdIifvxwb__neJ6y5U_Hx0Tc-nbI9uzhnq9FOKcB3Vt98mXOqASnXln942nDDiaPlSOE11RP55wj1DHeDvstdtcI5J12v7w22nciQGW_dR2vTZJPO87jdDequC8G7y06KQLkvVCiVKpXJJI5SDdq4KCtLIpMaUBJyyDFKM2NbWmv3j0qEBYFoNUCsXfhzwRqL5cJeMp4TyRW5AMskCBibFISRqRKJ0YgJZFfsjBZrtvLGGjO_Ttd_3n1gh93x62A26A37N-zIWxoTE3LLGsW6tHcuNij0fbUnvgCzr7ex
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=Pattern+Recognition%2C+1994+12th+International+Conference+On.+Vol.+1&rft.atitle=Performance+evaluation+of+texture+measures+with+classification+based+on+Kullback+discrimination+of+distributions&rft.au=Ojala%2C+T.&rft.au=Pietikainen%2C+M.&rft.au=Harwood%2C+D.&rft.date=1994-01-01&rft.pub=IEEE&rft.isbn=9780818662652&rft.volume=1&rft.spage=582&rft.epage=585+vol.1&rft_id=info:doi/10.1109%2FICPR.1994.576366&rft.externalDocID=576366
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780818662652/lc.gif&client=summon&freeimage=true
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780818662652/mc.gif&client=summon&freeimage=true
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780818662652/sc.gif&client=summon&freeimage=true