An experimental evaluation of selective mutation
Mutation testing is a technique for unit-testing software that, although powerful, is computationally expensive. The principal expense of mutation is that many variants of the test program, called mutants, must be repeatedly executed. Selective mutation is a way to approximate mutation testing that...
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Published in | Proceedings of 1993 15th International Conference on Software Engineering pp. 100 - 107 |
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Main Authors | , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE Comput. Soc. Press
1993
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Subjects | |
Online Access | Get full text |
ISBN | 9780818637001 0818637005 |
ISSN | 0270-5257 |
DOI | 10.1109/ICSE.1993.346062 |
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Abstract | Mutation testing is a technique for unit-testing software that, although powerful, is computationally expensive. The principal expense of mutation is that many variants of the test program, called mutants, must be repeatedly executed. Selective mutation is a way to approximate mutation testing that saves execution by reducing the number of mutants that must be executed. The authors report experimental results that compare selective mutation testing to standard, or nonselective, mutation testing. The results support the hypothesis that selective mutation is almost as strong as nonselective mutation. In experimental trials, selective mutations provide almost the same coverage as nonselective mutation, with significant reductions in cost.< > |
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AbstractList | Mutation testing is a technique for unit-testing software that, although powerful, is computationally expensive. The principal expense of mutation is that many variants of the test program, called mutants, must be repeatedly executed. Selective mutation is a way to approximate mutation testing that saves execution by reducing the number of mutants that must be executed. The authors report experimental results that compare selective mutation testing to standard, or nonselective, mutation testing. The results support the hypothesis that selective mutation is almost as strong as nonselective mutation. In experimental trials, selective mutations provide almost the same coverage as nonselective mutation, with significant reductions in cost.< > |
Author | Zapf, C. Rothermel, G. Offutt, A.J. |
Author_xml | – sequence: 1 givenname: A.J. surname: Offutt fullname: Offutt, A.J. organization: ISSE Dept., George Mason Univ., Fairfax, VA, USA – sequence: 2 givenname: G. surname: Rothermel fullname: Rothermel, G. – sequence: 3 givenname: C. surname: Zapf fullname: Zapf, C. |
BookMark | eNotj0FrwkAUhBeqUGtzLz3lDyR9b99mX_YowVZB6KHeZZO8hUhMxERp_31D7VwGhmH45knNur4TpV4QUkRwb9via52ic5SSsWD1g4oc55BjbokBcKYWoBmSTGf8qKJhOMIkQyYjXihYdbF8n-XSnKQbfRvLzbdXPzZ9F_chHqSVamxuEp-u41_6rObBt4NE_75U-_f1vtgku8-PbbHaJQ2yHhO2miuTg3UIgWpfImMgDSU6KLUY8BkbtpW3QlyHqWONrydOE3RNREv1ep9tRORwnvD85edwf0i_P25E2A |
ContentType | Conference Proceeding |
DBID | 6IE 6IL CBEJK RIE RIL |
DOI | 10.1109/ICSE.1993.346062 |
DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Xplore POP ALL IEEE Xplore All Conference Proceedings IEEE Xplore Digital Library (LUT) IEEE Proceedings Order Plans (POP All) 1998-Present |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Xplore Digital Library (LUT) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Computer Science |
EndPage | 107 |
ExternalDocumentID | 346062 |
GroupedDBID | -~X .4S .DC 123 23M 29O 5VS 6IE 6IF 6IH 6IK 6IL 6IM 6IN 8US AAJGR AAWTH ABLEC ADZIZ AFFNX ALMA_UNASSIGNED_HOLDINGS APO ARCSS AVWKF BEFXN BFFAM BGNUA BKEBE BPEOZ CBEJK CHZPO EDO FEDTE I-F I07 IEGSK IJVOP IPLJI M43 OCL RIE RIL RNS XOL |
ID | FETCH-LOGICAL-i172t-7627c4806910f3dab171f320b190b2e40a57476ca6e37df0f364ad2704f2d333 |
IEDL.DBID | RIE |
ISBN | 9780818637001 0818637005 |
ISSN | 0270-5257 |
IngestDate | Tue Aug 26 22:32:15 EDT 2025 |
IsPeerReviewed | false |
IsScholarly | true |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-i172t-7627c4806910f3dab171f320b190b2e40a57476ca6e37df0f364ad2704f2d333 |
PageCount | 8 |
ParticipantIDs | ieee_primary_346062 |
PublicationCentury | 1900 |
PublicationDate | 19930000 |
PublicationDateYYYYMMDD | 1993-01-01 |
PublicationDate_xml | – year: 1993 text: 19930000 |
PublicationDecade | 1990 |
PublicationTitle | Proceedings of 1993 15th International Conference on Software Engineering |
PublicationTitleAbbrev | ICSE |
PublicationYear | 1993 |
Publisher | IEEE Comput. Soc. Press |
Publisher_xml | – name: IEEE Comput. Soc. Press |
SSID | ssj0000434537 ssj0006499 |
Score | 1.5901011 |
Snippet | Mutation testing is a technique for unit-testing software that, although powerful, is computationally expensive. The principal expense of mutation is that many... |
SourceID | ieee |
SourceType | Publisher |
StartPage | 100 |
SubjectTerms | Application software Approximation methods Automatic testing Computational efficiency Costs Fault detection Genetic mutations Software quality Software testing System testing |
Title | An experimental evaluation of selective mutation |
URI | https://ieeexplore.ieee.org/document/346062 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3NS8MwFA-6k6fpnPhNDl7TpU2atEcZGyooghN2G0magIiduPbiX-9L0m0qHry1JVBek77v3-8hdGWola4sFTFGWALazxLNTE5MVhapElZa6dHI9w_i5pnfzfN5x7MdsDDW2tB8ZhN_GWr51dK0PlU2YhzcbdC3u3DKIlRrk06hnPF8G2uBoQ2jIyHoosQTfgbqx7QQTMKx64h31vfpunxJy9Ht-GniEXwsiS_7MXQl2JxpP4K5V4Gq0LeavCZtoxPz-YvI8Z_i7KPhFtyHHzdm6wDt2HqA-uvpDrj72Q8Rva7xd_5_vCUGx0uHV2GADuhK_NbGcv4QzaaT2fiGdPMVyAu4LQ0BPSgNL6gAl8GxSulUpo5lVIOToDPLqcoh2BAGtozJysEawVUFX5S7rGKMHaFevaztMcKlktpBsCsyp7nhRmlfbzXGB5dFLswJGnjxF--RQWMRJT_98-kZ2otNhT7NcY56zUdrL8DwN_oybPkXIvGlqQ |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3PS8MwFA4yD3qazom_zcFrurRJk_YoY2PqNgQn7DaaNAERO3Htxb_el7TbVDx4a0uhvKZ9P_Le930I3WhqpE3TjGgtDAHvZ4hiOiY6SpMwE0Ya6dDIk6kYPfP7eTxveLY9FsYY44fPTOAOfS8_X-rKbZX1GId0G_ztLoR9Htdgrc2GCuWMx9tqC0KtF4-EsosSR_npyR_DRDAJH15DvbM-D9cNTJr27vpPA4fhY0H9uB-yKz7qDNs1nHvlyQrdsMlrUJUq0J-_qBz_adAB6m7hffhxE7gO0Y4pOqi91nfAze9-hOhtgb8rAOAtNTheWrzyEjrgLfFbVTf0u2g2HMz6I9IoLJAXSFxKAp5Qap5QAUmDZXmmQhlaFlEFaYKKDKdZDOWG0LBoTOYW7hE8y-GNchvljLFj1CqWhTlBOM2kslDuisgqrrnOlOu4au3KyyQW-hR1nPmL95pDY1Fbfvbn1Wu0N5pNxovx3fThHO3XI4Zu0-MCtcqPylxCGlCqK7_8XwpOqPY |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=Proceedings+of+1993+15th+International+Conference+on+Software+Engineering&rft.atitle=An+experimental+evaluation+of+selective+mutation&rft.au=Offutt%2C+A.J.&rft.au=Rothermel%2C+G.&rft.au=Zapf%2C+C.&rft.date=1993-01-01&rft.pub=IEEE+Comput.+Soc.+Press&rft.isbn=9780818637001&rft.issn=0270-5257&rft.spage=100&rft.epage=107&rft_id=info:doi/10.1109%2FICSE.1993.346062&rft.externalDocID=346062 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0270-5257&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0270-5257&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0270-5257&client=summon |