Upgrading the NIST electrostatic force balance

After the adoption of a redefined SI, electrostatic force measurements will become an ideal way to realise forces at the sub-micronewton level in a laboratory setting using an instrument such as the NIST electrostatic force balance. The balance has recently undergone a complete replacement of the co...

Full description

Saved in:
Bibliographic Details
Published in2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) pp. 1 - 2
Main Authors Stirling, Julian, Shaw, Gordon A.
Format Conference Proceeding Journal Article
LanguageEnglish
Published IEEE 01.07.2016
Subjects
Online AccessGet full text

Cover

Loading…
Abstract After the adoption of a redefined SI, electrostatic force measurements will become an ideal way to realise forces at the sub-micronewton level in a laboratory setting using an instrument such as the NIST electrostatic force balance. The balance has recently undergone a complete replacement of the control system. We describe both the new updated control system and recent improvements to analysis and data collection.
AbstractList After the adoption of a redefined SI, electrostatic force measurements will become an ideal way to realise forces at the sub-micronewton level in a laboratory setting using an instrument such as the NIST electrostatic force balance. The balance has recently undergone a complete replacement of the control system. We describe both the new updated control system and recent improvements to analysis and data collection.
Author Stirling, Julian
Shaw, Gordon A.
Author_xml – sequence: 1
  givenname: Julian
  surname: Stirling
  fullname: Stirling, Julian
  email: julian.stirling@nist.gov
  organization: Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
– sequence: 2
  givenname: Gordon A.
  surname: Shaw
  fullname: Shaw, Gordon A.
  organization: Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
BookMark eNotkDtPwzAURg0CibbwAxBLRpaEe-3EjxFFLVQqD4l2jmznugSlSYnTgX9PpXY6y9HRp2_Krrq-I8buETJEME_l5_wt44AyU0UOSpkLNsVcKmFQ5Pklm3CUkAIqvGHTGH8AeA4gJizb7LeDrZtum4zflLwvv9YJteTHoY-jHRufhH7wlDjb2s7TLbsOto10d-aMbRbzdfmarj5eluXzKm1QSpOiCBqQgtbOcMfBUXAWgoPaiUJJRyA8EICpteGaa13LULugAAsrrddixh5P3f3Q_x4ojtWuiZ7a4wjqD7FCLQrJQQt-VB9OakNE1X5odnb4q843iH-KxVF4
ContentType Conference Proceeding
Journal Article
DBID 6IE
6IH
CBEJK
RIE
RIO
7SP
8FD
L7M
DOI 10.1109/CPEM.2016.7540779
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library Online
IEEE Proceedings Order Plans (POP) 1998-present
Electronics & Communications Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
DatabaseTitle Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
DatabaseTitleList
Technology Research Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE/IET Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Physics
EISBN 1467391344
9781467391344
9781467391320
1467391328
EISSN 2160-0171
EndPage 2
ExternalDocumentID 7540779
Genre orig-research
GroupedDBID -~X
29F
6IE
6IF
6IH
6IK
6IL
6IM
6IN
AAJGR
ACGFS
ADZIZ
AFFNX
AI.
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
IEGSK
IJVOP
IPLJI
JC5
M43
OCL
RIE
RIG
RIL
RIO
RNS
VH1
7SP
8FD
L7M
ID FETCH-LOGICAL-i1669-13f801ef88b92b20befba0fb0db3576be03c0e009d8928288d6fdbf7015a6ac83
IEDL.DBID RIE
IngestDate Thu Apr 11 15:35:05 EDT 2024
Wed Jun 26 19:23:51 EDT 2024
IsDoiOpenAccess false
IsOpenAccess true
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i1669-13f801ef88b92b20befba0fb0db3576be03c0e009d8928288d6fdbf7015a6ac83
Notes ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Conference-1
ObjectType-Feature-3
content type line 23
SourceType-Conference Papers & Proceedings-2
OpenAccessLink https://zenodo.org/record/1266750/files/article.pdf
PQID 1835620832
PQPubID 23500
PageCount 2
ParticipantIDs proquest_miscellaneous_1835620832
ieee_primary_7540779
PublicationCentury 2000
PublicationDate 20160701
PublicationDateYYYYMMDD 2016-07-01
PublicationDate_xml – month: 07
  year: 2016
  text: 20160701
  day: 01
PublicationDecade 2010
PublicationTitle 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)
PublicationTitleAbbrev CPEM
PublicationYear 2016
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0024003
Score 2.0046542
Snippet After the adoption of a redefined SI, electrostatic force measurements will become an ideal way to realise forces at the sub-micronewton level in a laboratory...
SourceID proquest
ieee
SourceType Aggregation Database
Publisher
StartPage 1
SubjectTerms Capacitors
Conferences
Control systems
Data acquisition
Electromagnetic measurement
Electrostatic force
Electrostatic measurements
Electrostatics
Force
Force measurement
NIST
precision measurements
Redefinition of the SI
small force metrology
Upgrading
Title Upgrading the NIST electrostatic force balance
URI https://ieeexplore.ieee.org/document/7540779
https://search.proquest.com/docview/1835620832
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LawIxEA4qFHrqQ0vtiy302F2zj26Ssyi2oAhV8LbsZCdFCquoe-mv72R3VWh76C2XhLzI903mmxnGnnxUyigRujpS4EYEgK6MkVocRBAKrQNlA4XHk3g0j94WL4sGez7EwiBiKT5DzzZLX3620oX9KusJmy1OqCZrCqWqWK1jXj26nrXX0ueq158Oxla4FXt1p7p6yq8nt8SR4Rkb72dQyUc-vWIHnv76kZzxv1M8Z51jxJ4zPWDRBWtgfslOSnmn3raZN19_bEq1vEOEz5m8vs-cugCOjShaaoe4Kw0BVuioscPmw8GsP3LrSgnu0o9j5fqhIaRBIyWoAAIOaCDlBngGIRkUgDzUHIlOZVJZG0tmscnACOICaZxqGV6xVr7K8Zo5OgPfSAhSDjzCNFZEmAwZmX4mQGoRdVnbrjpZV8kwknrBXfa439eELqj1OqQ5roptQm8GcSxiesHN311v2ak9qEoDe8dau02B94T0O3goj_gbi2aoGQ
link.rule.ids 310,311,315,783,787,792,793,799,23942,23943,25152,27936,27937,55086
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LTwIxEJ4gxujJBxjxuSYe3aX7sNueCQQUCImQcNvsdFtDTIDwuPjrnS4LJOrBWy9t-kq_bzrfzAA8-VpKI-PQVZFENyIAdAXX1GIYB2GsVCBtoHCvz9uj6HX8Mi7B8y4WRmudi8-0Z5u5Lz-bqbX9KqvHNltcLA_gkHi14JtorX1mPbqghd_SZ7LeGDR7VrrFvaJbUT_l16ObI0nrFHrbOWwEJJ_eeoWe-vqRnvG_kzyD6j5mzxns0OgcSnp6AUe5wFMtK-CN5h-LXC_vEOVz-p33oVOUwLExRRPlEHulIdBKHZWuwqjVHDbablErwZ34nEvXDw1hjTZCoAwwYKgNpswgyzAkkwI1CxXTRKgyIa2VJTJuMjQxsYGUp0qEl1Cezqb6ChyVoW8EBilDFumUS6JMhsxMP4tRqDiqQcWuOplv0mEkxYJr8Ljd14SuqPU7pFM9Wy8TejWIZRHXC67_7voAx-1hr5t0O_23Gzixh7ZRxN5CebVY6zvC_RXe58f9DYT7q2Q
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=proceeding&rft.title=2016+Conference+on+Precision+Electromagnetic+Measurements+%28CPEM+2016%29&rft.atitle=Upgrading+the+NIST+electrostatic+force+balance&rft.au=Stirling%2C+Julian&rft.au=Shaw%2C+Gordon+A.&rft.date=2016-07-01&rft.pub=IEEE&rft.eissn=2160-0171&rft.spage=1&rft.epage=2&rft_id=info:doi/10.1109%2FCPEM.2016.7540779&rft.externalDocID=7540779