Universal probabilistic analysis for cut sequences in dynamic fault trees

• Published in: 2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS) pp. 741 - 745
• Main Authors: Bo Wang, Changhua Jiang, Li Wang, Yulin Xu, Chunhui Wang
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.08.2014
• Subjects: Analytical models; cut sequence; Discrete Fourier transforms; dynamic fault tree; Fault trees; Logic gates; Markov processes; probabilistic; Probabilistic logic; quantitative analysis; Statistical analysis

Cut sequence, an events' sequence failing in a specific order that can induce the top event, is an algebraic approach to overcome the shortcomings of the traditional methods for dynamic fault trees (DFTs) analysis. The former researchers have done a lot of work for cut sequence' qualitativ...