Statistical aspects of FinFET based SRAM metrics subject to process and statistical variability - Xingsheng Wang; Binjie Cheng; Millar, Campbell; Reid, Dave; Asenov, Asen (2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 2014)
Keywords: FinFETs; Integrated circuit modeling; Layout; Measurement; Random access memory; Semiconductor process modeling