FinFET: From compact modeling to circuit performance - He, F; Xingye Zhou; Chenyue Ma; Jian Zhang; Zhiwei Liu; Wen Wu; Xukai Zhang; Lining Zhang (2010 IEEE International Conference of Electron Devices and Solid-State Circuits, 2010)
Keywords: circuit performance; CMOS integrated circuits; compact modeling; FinFET; Laboratories; Logic gates; reliability analysis; Semiconductor device modeling; simulation; Stress; Topology