Learning-based dynamic reliability management for dark silicon processor considering EM effects - Taeyoung Kim; Xin Huang; Hai-Bao Chen; Sukharev, Valeriy; Tan, Sheldon X.-D (Proceedings - Design, Automation, and Test in Europe Conference and Exhibition, 2016)
Keywords: Dynamical systems; Dynamics; Electric power generation; Energy consumption; Management; Mathematical models; Microprocessors; Power system dynamics; Power system reliability; Reliability; Silicon; Wires