APA (7th ed.) Citation

Kim, T., Huang, X., Chen, H., Sukharev, V., & Tan, S. X. (2016, March). Learning-based dynamic reliability management for dark silicon processor considering EM effects. Proceedings - Design, Automation, and Test in Europe Conference and Exhibition, 463-468.

Chicago Style (17th ed.) Citation

Kim, Taeyoung, Xin Huang, Hai-Bao Chen, Valeriy Sukharev, and Sheldon X.-D Tan. "Learning-based Dynamic Reliability Management for Dark Silicon Processor Considering EM Effects." Proceedings - Design, Automation, and Test in Europe Conference and Exhibition Mar. 2016: 463-468.

MLA (9th ed.) Citation

Kim, Taeyoung, et al. "Learning-based Dynamic Reliability Management for Dark Silicon Processor Considering EM Effects." Proceedings - Design, Automation, and Test in Europe Conference and Exhibition, Mar. 2016, pp. 463-468.