Bad Smells in Industrial Automation: Sniffing out Feature Envy - Sonnleithner, Lisa; Rabiser, Rick; Zoitl, Alois (2022 48th Euromicro Conference on Software Engineering and Advanced Applications (SEAA), 2022)
Keywords: anti-pattern; Automation; bad smell; code smell; Control systems; CPPS; CPS; design smell; distributed control system; Feature Envy; Feature extraction; IEC 61499; IEC Standards; Maintenance engineering; measure; metric; Production systems; Software systems