Trustworthiness Evaluation System of UEIOT Devices Based on Deep Learning

• Published in: 2023 International Conference on Networks, Communications and Intelligent Computing (NCIC) pp. 116 - 122
• Main Authors: Chen, Cen, Wang, Ming, Li, Nuannuan, Lv, Zhuo, Li, Mingyan, Chang, Hao
• Format: Conference Proceeding
• Language: English
• Published: IEEE 17.11.2023
• Subjects: CNN; Computational modeling; Data mining; Deep learning; DQN; Feature extraction; Internet of Things; MLP; Smart grids; Training; UEIOT

With the rising popularity of smart devices and the growth of IoT applications, AI technology is thriving in edge computing environments. These environments provide ample opportunities for applying AI due to the abundance of realtime sensing data and diverse application scenarios. Moreover, AI techn...