APA (7th ed.) Citation

Chen, C., Wang, M., Li, N., Lv, Z., Li, M., & Chang, H. (2023, November 17). Trustworthiness Evaluation System of UEIOT Devices Based on Deep Learning. 2023 International Conference on Networks, Communications and Intelligent Computing (NCIC), 116-122. https://doi.org/10.1109/NCIC61838.2023.00026

Chicago Style (17th ed.) Citation

Chen, Cen, Ming Wang, Nuannuan Li, Zhuo Lv, Mingyan Li, and Hao Chang. "Trustworthiness Evaluation System of UEIOT Devices Based on Deep Learning." 2023 International Conference on Networks, Communications and Intelligent Computing (NCIC) 17 Nov. 2023: 116-122. https://doi.org/10.1109/NCIC61838.2023.00026.

MLA (9th ed.) Citation

Chen, Cen, et al. "Trustworthiness Evaluation System of UEIOT Devices Based on Deep Learning." 2023 International Conference on Networks, Communications and Intelligent Computing (NCIC), 17 Nov. 2023, pp. 116-122, https://doi.org/10.1109/NCIC61838.2023.00026.