APA (7th ed.) Citation

Ren, J., Gabbar, H. A., Huang, X., & Saberironaghi, A. (2022, July 14). Defect Detection for Printed Circuit Board Assembly Using Deep Learning. 2022 8th International Conference on Control Science and Systems Engineering (ICCSSE), 85-89. https://doi.org/10.1109/ICCSSE55346.2022.10079777

Chicago Style (17th ed.) Citation

Ren, Jing, Hossam A. Gabbar, Xishi Huang, and Alireza Saberironaghi. "Defect Detection for Printed Circuit Board Assembly Using Deep Learning." 2022 8th International Conference on Control Science and Systems Engineering (ICCSSE) 14 Jul. 2022: 85-89. https://doi.org/10.1109/ICCSSE55346.2022.10079777.

MLA (9th ed.) Citation

Ren, Jing, et al. "Defect Detection for Printed Circuit Board Assembly Using Deep Learning." 2022 8th International Conference on Control Science and Systems Engineering (ICCSSE), 14 Jul. 2022, pp. 85-89, https://doi.org/10.1109/ICCSSE55346.2022.10079777.