Deep Learning Strategies for Addressing Anomalous Exposure in Image Processing: The FARDBUNet Approach

• Published in: 2023 International Conference on High Performance Big Data and Intelligent Systems (HDIS) pp. 39 - 46
• Main Authors: Zhou, Qi, Yang, Kai, Ke, Zunwang, Wang, Gang, Zhang, Yugui, Jia, Yizhen, Cao, Fengcai, Ma, Junxiao, Liu, Changlin, Zhang, Kaijie, Wu, Min
• Format: Conference Proceeding
• Language: English
• Published: IEEE 06.12.2023
• Subjects: Attention; Calibration; Deep learning; Exposure correction; Image enhancement; Image quality; Imaging; Lighting; Robustness; Task analysis; Technological innovation

In real-world scenarios, capturing scenes with excessive dynamic range often leads to the partial loss of highlight or dark area information due to irradiance variations and limitations in the capture capabilities of imaging devices caused by their size and material constraints. This phenomenon give...