Stacked Autoencoder for Wavelet-Based the EMI Signal analysis

• Published in: 2021 International Conference on Artificial Intelligence and Electromechanical Automation (AIEA) pp. 126 - 129
• Main Authors: Li, Hongyi, Yang, Yuan, Peng, Zhen, Zhao, Di
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.05.2021
• Subjects: Clustering algorithms; Electric potential; Electromagnetic interference; EMI; Error analysis; Feature extraction; Fréchet distance; Stacked Autoencoder; Wavelet; Wavelet analysis; Wavelet transforms

One way to analyze and improve the electromagnetic compatibility (EMC) of an electronic system is to sample multiple signals and then locating the electromagnetic interference (EMI) sources. First, each signal is decomposed into sub-signals using wavelet transform in which contains potential interes...