Stacked Autoencoder for Wavelet-Based the EMI Signal analysis - Li, Hongyi; Yang, Yuan; Peng, Zhen; Zhao, Di (2021 International Conference on Artificial Intelligence and Electromechanical Automation (AIEA), 2021)
Keywords: Clustering algorithms; Electric potential; Electromagnetic interference; EMI; Error analysis; Feature extraction; Fréchet distance; Stacked Autoencoder; Wavelet; Wavelet analysis; Wavelet transforms