Modern Approach to Device Quality Evaluation by the Modified Expert-Statistical Method and Genetic Algorithm
The paper proposes a new modified expert-statistical method for device quality evaluation, which could be applied to predict its characteristics. The underlying principle of the method is the replacement of complex mathematical models by genetic algorithm-based machine learning.
Saved in:
Published in | 2019 XXII International Conference on Soft Computing and Measurements (SCM) pp. 142 - 145 |
---|---|
Main Authors | , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.05.2019
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Be the first to leave a comment!