Modern Approach to Device Quality Evaluation by the Modified Expert-Statistical Method and Genetic Algorithm

• Published in: 2019 XXII International Conference on Soft Computing and Measurements (SCM) pp. 142 - 145
• Main Authors: Bishard, E. G., Minina, A. A., Filipov, S. J.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.05.2019
• Subjects: device quality evaluation; expert-statistical methods; genetic algorithms; quality

The paper proposes a new modified expert-statistical method for device quality evaluation, which could be applied to predict its characteristics. The underlying principle of the method is the replacement of complex mathematical models by genetic algorithm-based machine learning.