Tracking of objects in motion-distorted scanning electron microscope images
Microrobotics is a field of high interest in the recent past. Commonly used imaging modalities in this field include optical microscopes and scanning electron microscopes (SEM). Due to the scanning principle of the SEMs, objects in motion may not be represented in the SEM images the same way as they...
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Published in | 2011 IEEE/RSJ International Conference on Intelligent Robots and Systems pp. 19 - 24 |
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Main Authors | , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.09.2011
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Abstract | Microrobotics is a field of high interest in the recent past. Commonly used imaging modalities in this field include optical microscopes and scanning electron microscopes (SEM). Due to the scanning principle of the SEMs, objects in motion may not be represented in the SEM images the same way as they really are. Movement leads to movement artifacts. This effect strongly limits the possibilities for the use of image based methods for tracking and recognition and it also limits the possible speeds achievable for automated procedures. In this work, a tracking algorithm is proposed which is robust to artifacts and distortions generated by object motion. The algorithm is tested and validated in experiments. |
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AbstractList | Microrobotics is a field of high interest in the recent past. Commonly used imaging modalities in this field include optical microscopes and scanning electron microscopes (SEM). Due to the scanning principle of the SEMs, objects in motion may not be represented in the SEM images the same way as they really are. Movement leads to movement artifacts. This effect strongly limits the possibilities for the use of image based methods for tracking and recognition and it also limits the possible speeds achievable for automated procedures. In this work, a tracking algorithm is proposed which is robust to artifacts and distortions generated by object motion. The algorithm is tested and validated in experiments. |
Author | Dahmen, Christian Fatikow, Sergej |
Author_xml | – sequence: 1 givenname: Christian surname: Dahmen fullname: Dahmen, Christian organization: Division Microrobotics and Control Engineering, University of Oldenburg, Germany – sequence: 2 givenname: Sergej surname: Fatikow fullname: Fatikow, Sergej organization: Division Microrobotics and Control Engineering, University of Oldenburg, Germany |
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Snippet | Microrobotics is a field of high interest in the recent past. Commonly used imaging modalities in this field include optical microscopes and scanning electron... |
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SubjectTerms | Algorithm design and analysis Correlation Optical microscopy Scanning electron microscopy Tracking |
Title | Tracking of objects in motion-distorted scanning electron microscope images |
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