A second beam-diagnostic beamline for the Advanced Light Source
A second beamline, BL 7.2, completely dedicated to beam diagnostics is being installed at the Advanced Light Source (ALS). The design has been optimized for the measurement of the momentum spread and emittance of the stored beam in combination with the existing diagnostic beamline, BL 3.1. A detaile...
Saved in:
Published in | Proceedings of the 2003 Particle Accelerator Conference Vol. 4; pp. 2527 - 2529 vol.4 |
---|---|
Main Authors | , , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
2003
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | A second beamline, BL 7.2, completely dedicated to beam diagnostics is being installed at the Advanced Light Source (ALS). The design has been optimized for the measurement of the momentum spread and emittance of the stored beam in combination with the existing diagnostic beamline, BL 3.1. A detailed analysis of the experimental error has allowed the definition of the system parameters. The obtained requirements found a good matching with a simple and reliable system based on the detection of X-ray synchrotron radiation (SR) through a pinhole system. The actual beamline, which also includes a port for visible and infrared SR as well as an X-ray beam position monitor (BPM), is mainly based on the design of two similar diagnostic beamlines at BESSY II. This approach allowed a significant saving in time, cost and engineering effort. The design criteria, including a summary of the experimental error analysis, as well as a brief description of the beamline are presented. |
---|---|
AbstractList | A second beamline, BL 7.2, completely dedicated to beam diagnostics is being installed at the Advanced Light Source (ALS). The design has been optimized for the measurement of the momentum spread and emittance of the stored beam in combination with the existing diagnostic beamline, BL 3.1. A detailed analysis of the experimental error has allowed the definition of the system parameters. The obtained requirements found a good matching with a simple and reliable system based on the detection of X-ray synchrotron radiation (SR) through a pinhole system. The actual beamline, which also includes a port for visible and infrared SR as well as an X-ray beam position monitor (BPM), is mainly based on the design of two similar diagnostic beamlines at BESSY II. This approach allowed a significant saving in time, cost and engineering effort. The design criteria, including a summary of the experimental error analysis, as well as a brief description of the beamline are presented. |
Author | Baum, D. Sannibale, F. Kelez, N. Holldack, K. Scarvie, T. |
Author_xml | – sequence: 1 givenname: F. surname: Sannibale fullname: Sannibale, F. organization: LBNL, Berkeley, CA, USA – sequence: 2 givenname: D. surname: Baum fullname: Baum, D. organization: LBNL, Berkeley, CA, USA – sequence: 3 givenname: N. surname: Kelez fullname: Kelez, N. organization: LBNL, Berkeley, CA, USA – sequence: 4 givenname: T. surname: Scarvie fullname: Scarvie, T. organization: LBNL, Berkeley, CA, USA – sequence: 5 givenname: K. surname: Holldack fullname: Holldack, K. |
BookMark | eNotj0FLw0AUhBetYFp7F7zsH0h8b1-ymz1JCFaFgIJ6LpvsS7vSJpJEwX9v0MIw881lYJZi0fUdC3GNkCCCvX0pykQBUIIqt2j0mYgUZiq2OjXnYm1NDrPIGMrNQkQImmKyKr8Uy3H8AMgILEbirpAjN33nZc3uGPvgdl0_TqH564fQsWz7QU57loX_dl3DXlZht5_ka_81NHwlLlp3GHl9ypV439y_lY9x9fzwVBZVHBCyKU5Bpdls1hLXjDbzztsGkXymdY4zMmjlUuaWkVJSLTXaMRA7m3pT00rc_O8GZt5-DuHohp_t6Tv9AoOtS2s |
ContentType | Conference Proceeding |
DBID | 6IE 6IH CBEJK RIE RIO |
DOI | 10.1109/PAC.2003.1289176 |
DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Proceedings Order Plan (POP) 1998-present by volume IEEE Xplore All Conference Proceedings IEEE Electronic Library Online IEEE Proceedings Order Plans (POP) 1998-present |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library Online url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Physics |
EISSN | 2152-9647 |
EndPage | 2529 vol.4 |
ExternalDocumentID | 1289176 |
GroupedDBID | 29F 6IE 6IH CBEJK JC5 RIE RIO |
ID | FETCH-LOGICAL-i105t-40245402993ebe195dad9c113d566819c1e062a4eefe13432f3c6ae03ea94d7b3 |
IEDL.DBID | RIE |
ISBN | 9780780377387 0780377389 |
ISSN | 1063-3928 |
IngestDate | Wed Jun 26 19:21:00 EDT 2024 |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-i105t-40245402993ebe195dad9c113d566819c1e062a4eefe13432f3c6ae03ea94d7b3 |
ParticipantIDs | ieee_primary_1289176 |
PublicationCentury | 2000 |
PublicationDate | 20030000 |
PublicationDateYYYYMMDD | 2003-01-01 |
PublicationDate_xml | – year: 2003 text: 20030000 |
PublicationDecade | 2000 |
PublicationTitle | Proceedings of the 2003 Particle Accelerator Conference |
PublicationTitleAbbrev | PAC |
PublicationYear | 2003 |
Publisher | IEEE |
Publisher_xml | – name: IEEE |
SSID | ssj0053091 ssj0000453961 |
Score | 1.3364571 |
Snippet | A second beamline, BL 7.2, completely dedicated to beam diagnostics is being installed at the Advanced Light Source (ALS). The design has been optimized for... |
SourceID | ieee |
SourceType | Publisher |
StartPage | 2527 |
SubjectTerms | Costs Design optimization Infrared surveillance Light sources Monitoring Radiation detectors Strontium Synchrotron radiation X-ray detection X-ray detectors |
Title | A second beam-diagnostic beamline for the Advanced Light Source |
URI | https://ieeexplore.ieee.org/document/1289176 |
Volume | 4 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8NAEB7aguDJRyu-2YNHN026ee1JSrEUsVLQQm9lH1MQsS02vfjrnd2kEcWDt2wuSXbCzvfNfDMDcNMjty5NoniYYsZjkRuuhVEcIy1jS4dmHrsC5_FTOprGD7Nk1oDbuhYGEb34DAN36XP5dmW2LlTWpbOU2EXahGYmZVmrVcdTCJoImdbyjkSEfloeMR7BCQPknrLnocgyctFV553dOtvlL0PZnfQHvktoUD3sx9QV73SGBzDevW6pNXkLtoUOzOevTo7__Z5D6HyX97FJ7biOoIHLY9jzWlCzacNdn20cTbZMo3rnthTj0Q_m1w6WMkK6jJAj61cKAvboOD579pmADkyH9y-DEa_mLPBXQleFo5CuDx85JkEmjWRilZUmioQlrEeIwUQYpj0VIy4wcoWoC2FShaFARfbMtDiB1nK1xFNgMldSSMTEIEEd29OOgBplRYxG6zQ7g7bbhvm6bKUxr3bg_O_bF7DvtXM-4nEJreJji1eEAQp97Y3_BRBKqAE |
link.rule.ids | 310,311,783,787,792,793,799,4057,4058,27937,55086 |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LTwIxEG4QY_TkA4xve_Bol126292eDCESVCAkQsKN9DEkxghGlou_3ml3wWg8eNvupbtt0_m-mW9mCLlpolmXJlEsFJCymGeGaW4Ug0jL2OKlmcUuwbk_EN1x_DhJJhVyu8mFAQAvPoPAPfpYvl2YlXOVNfAuRXYhtsg24upMFNlaG48KghMuxUbgkfDQ98tDzsMZooDMk_Ys5GmKRrqsvbMep-sIZigbw1bb1wkNyul-9F3xZqezT_rrDy7UJq_BKteB-fxVy_G_f3RA6t8JfnS4MV2HpALzI7Lj1aBmWSN3Lbp0RNlSDeqN2UKOh0fMjx0wpYh1KWJH2io1BLTnWD599rGAOhl37kftLis7LbAXxFe5I5GuEh-aJo6bGsnEKitNFHGLaA8xg4kgFE0VA8wgcqmoM26EgpCDwh1NNT8m1fliDieEykxJLgESAwh2bFM7CmqU5TEYrUV6SmpuGabvRTGNabkCZ3-_via73VG_N-09DJ7OyZ5X0nn_xwWp5h8ruEREkOsrfxC-ABMhq0w |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=Proceedings+of+the+2003+Particle+Accelerator+Conference&rft.atitle=A+second+beam-diagnostic+beamline+for+the+Advanced+Light+Source&rft.au=Sannibale%2C+F.&rft.au=Baum%2C+D.&rft.au=Kelez%2C+N.&rft.au=Scarvie%2C+T.&rft.date=2003-01-01&rft.pub=IEEE&rft.isbn=9780780377387&rft.issn=1063-3928&rft.eissn=2152-9647&rft.volume=4&rft.spage=2527&rft.epage=2529+vol.4&rft_id=info:doi/10.1109%2FPAC.2003.1289176&rft.externalDocID=1289176 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1063-3928&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1063-3928&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1063-3928&client=summon |