Harmonic loading-related performance of power line filters for shielded enclosures
Power line filters (PLFs) are used to maintain integrity of shielded enclosures by preventing unwanted signals from either entering or leaving the enclosure via the power supply conductors. These filters are intended to provide a high insertion loss-typically about 100 dB-above 14 kHz without affect...
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Published in | 1998 IEEE EMC Symposium. International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.98CH36253) Vol. 2; pp. 1064 - 1070 vol.2 |
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Main Authors | , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
1998
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Subjects | |
Online Access | Get full text |
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Abstract | Power line filters (PLFs) are used to maintain integrity of shielded enclosures by preventing unwanted signals from either entering or leaving the enclosure via the power supply conductors. These filters are intended to provide a high insertion loss-typically about 100 dB-above 14 kHz without affecting the quality of the power frequency voltage waveform that is fed to equipment inside the enclosure. Connecting nonlinear loads to these filters will distort the filter input and output voltage waveform, cause increased filter heating, and diminish filter attenuation performance. Most performance specifications require PLFs to have less than 1% fundamental voltage drop under rated load conditions and require a voltage-drop test at rated load. This paper shows that this test is inadequate if the load consists of typical electronic equipment, and proposes a new waveform quality test to augment the test described in military standards commonly used by industry. The new test will identify any degradation in voltage quality caused by the connection of a PLF between a power source and equipment in a shielded enclosure. |
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AbstractList | Power line filters (PLFs) are used to maintain integrity of shielded enclosures by preventing unwanted signals from either entering or leaving the enclosure via the power supply conductors. These filters are intended to provide a high insertion loss-typically about 100 dB-above 14 kHz without affecting the quality of the power frequency voltage waveform that is fed to equipment inside the enclosure. Connecting nonlinear loads to these filters will distort the filter input and output voltage waveform, cause increased filter heating, and diminish filter attenuation performance. Most performance specifications require PLFs to have less than 1% fundamental voltage drop under rated load conditions and require a voltage-drop test at rated load. This paper shows that this test is inadequate if the load consists of typical electronic equipment, and proposes a new waveform quality test to augment the test described in military standards commonly used by industry. The new test will identify any degradation in voltage quality caused by the connection of a PLF between a power source and equipment in a shielded enclosure. |
Author | Key, T.S. Mansoor, A. |
Author_xml | – sequence: 1 givenname: A. surname: Mansoor fullname: Mansoor, A. organization: EPRI Power Electron. Appl. Center, Knoxille, TN, USA – sequence: 2 givenname: T.S. surname: Key fullname: Key, T.S. |
BookMark | eNotT9tKxDAUDKigrv0AfcoPdD2xubSPUlZ3YUXw8ryk6YlG0qQkFfHvDazDcIZhhgNzSU5DDEjINYM1Y9Dd7l43T_2adV27VgIaIU9I1akWChsBTLBzUuX8BQVclIK8IC9bnaYYnKE-6tGFjzqh1wuOdMZkY5p0MEijpXP8wUS9C0it8wumTEtM86dDP5Y6BuNj_k6Yr8iZ1T5j9a8r8v6weeu39f75cdff72vHgC_1aJgAWa4SRvKOjwNI0FD8MMDINW-V0kyilS0frMJWaG6EEgzvmEarmhW5Of51iHiYk5t0-j0chzd_4mRRRg |
ContentType | Conference Proceeding |
DBID | 6IE 6IH CBEJK RIE RIO |
DOI | 10.1109/ISEMC.1998.750356 |
DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Proceedings Order Plan (POP) 1998-present by volume IEEE Xplore All Conference Proceedings IEEE/IET Electronic Library (IEL) IEEE Proceedings Order Plans (POP) 1998-present |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: RIE name: IEEE/IET Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
EndPage | 1070 vol.2 |
ExternalDocumentID | 750356 |
GroupedDBID | 6IE 6IH 6IK 6IL AAJGR ACGHX ALMA_UNASSIGNED_HOLDINGS BEFXN BFFAM BGNUA BKEBE BPEOZ CBEJK OCL RIE RIL RIO |
ID | FETCH-LOGICAL-i104t-dc1506dc175c6494db060a0c17bb0d4a4877a16ef684bf7e85a4c5751e21aef73 |
IEDL.DBID | RIE |
ISBN | 9780780350151 0780350154 |
IngestDate | Wed Jun 26 19:26:56 EDT 2024 |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-i104t-dc1506dc175c6494db060a0c17bb0d4a4877a16ef684bf7e85a4c5751e21aef73 |
ParticipantIDs | ieee_primary_750356 |
PublicationCentury | 1900 |
PublicationDate | 19980000 |
PublicationDateYYYYMMDD | 1998-01-01 |
PublicationDate_xml | – year: 1998 text: 19980000 |
PublicationDecade | 1990 |
PublicationTitle | 1998 IEEE EMC Symposium. International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.98CH36253) |
PublicationTitleAbbrev | ISEMC |
PublicationYear | 1998 |
Publisher | IEEE |
Publisher_xml | – name: IEEE |
SSID | ssj0000455036 |
Score | 1.2699997 |
Snippet | Power line filters (PLFs) are used to maintain integrity of shielded enclosures by preventing unwanted signals from either entering or leaving the enclosure... |
SourceID | ieee |
SourceType | Publisher |
StartPage | 1064 |
SubjectTerms | Conductors Electronic equipment testing Frequency Insertion loss Joining processes Power filters Power harmonic filters Power supplies Power system harmonics Voltage |
Title | Harmonic loading-related performance of power line filters for shielded enclosures |
URI | https://ieeexplore.ieee.org/document/750356 |
Volume | 2 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV09T8MwELVoJya-ioAC8sCa1GmcxJmrVgWpCAGVulX-OIuK0lRNuvDr8TmhFYiBJbLjxLIuw-Xu3XtHyF2GvWhyIwMXz9rAebwkyAFFP7ULnlGwSkZIFJ48puMpf5gls0Zn23NhAMAXn0GIQ4_lm0JvMVXWQ8wtSVukJVi_pmrt0ikM2blx6gNz4dGyhDf6Ot_zqAE1I5b37l-GkwEy9URYb_qjuYr3LaOjmrRdeklCLCl5D7eVCvXnL8HGfx77mHT2JD76tHNPJ-QAVmfkeSw3H6iGS5eFr54PPJkFDF3vGQS0sHSN3dMo_oNSu0BEvaRumZZvWPHmHnfbLwvMLpYdMh0NXwfjoGmrECxc7FUFRqOqoLtmiU55zo1iKZPMzZVihksXwmQySsGmgiubgUgk1wjPQD-SYLP4nLRXxQouCFUijrWwkWY254pzGTvrGu7eARAmji7JKZpjvq6VM-a1Ja7-vNslhzXfD9Mb16RdbbZw4xx-pW79p_4Cn0SngQ |
link.rule.ids | 310,311,786,790,795,796,802,4069,4070,27958,55109 |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV07T8MwELagDDDxKuKNB9akCXFec9UqhbZC0ErdKj_OoqI0VZMu_Hp8TmgFYmCJ4ji2ovNwufvu-46Q-xh70aSKOyae1Y7xeKGTAop-ShM8o2AV95EoPBhG2Zg9TsJJrbNtuTAAYIvPwMVbi-WrXK4xVdZCzC2MdsmecfNeWpG1NgkVD_m5QWRD88TiZSGrFXa-x34Na5rFrd5rZ9BGrl7iVtv-aK9ivUv3sKJtF1aUEItK3t11KVz5-Uuy8Z8ffkSaWxoffd44qGOyA4tT8pLx1Qfq4dJ5buvnHUtnAUWXWw4BzTVdYv80in-hVM8QUy-omabFG9a8mdfN9vMc84tFk4y7nVE7c-rGCs7MRF-loyTqCpprHMqIpUwJL_K4Z8ZCeIpxE8TE3I9ARwkTOoYk5EwiQAMPPgcdB2ekscgXcE6oSIJAJtqXnk6ZYIwHxrqKmTUAiQr8C3KC5pguK-2MaWWJyz-f3pH9bDToT_u94dMVOajYf5jsuCaNcrWGG-P-S3Frj_0LqFSq1w |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=1998+IEEE+EMC+Symposium.+International+Symposium+on+Electromagnetic+Compatibility.+Symposium+Record+%28Cat.+No.98CH36253%29&rft.atitle=Harmonic+loading-related+performance+of+power+line+filters+for+shielded+enclosures&rft.au=Mansoor%2C+A.&rft.au=Key%2C+T.S.&rft.date=1998-01-01&rft.pub=IEEE&rft.isbn=9780780350151&rft.volume=2&rft.spage=1064&rft.epage=1070+vol.2&rft_id=info:doi/10.1109%2FISEMC.1998.750356&rft.externalDocID=750356 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780780350151/lc.gif&client=summon&freeimage=true |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780780350151/mc.gif&client=summon&freeimage=true |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780780350151/sc.gif&client=summon&freeimage=true |