ZAMBEZI: a parallel pattern parallel fault sequential circuit fault simulator

Sequential circuit fault simulators use the multiple bits in a computer data word to accelerate simulation. We introduce, and implement, a new sequential circuit fault simulator, a parallel pattern parallel fault simulator, ZAMBEZI, which simultaneously simulates multiple faults with multiple vector...

Full description

Saved in:
Bibliographic Details
Published inProceedings of 14th VLSI Test Symposium pp. 438 - 443
Main Authors Amin, M.B., Vinnakota, B.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1996
Subjects
Online AccessGet full text

Cover

Loading…
Abstract Sequential circuit fault simulators use the multiple bits in a computer data word to accelerate simulation. We introduce, and implement, a new sequential circuit fault simulator, a parallel pattern parallel fault simulator, ZAMBEZI, which simultaneously simulates multiple faults with multiple vectors in one data word. ZAMBEZI is developed by enhancing the control flow, of existing parallel pattern algorithms. For a very wide range of benchmark circuits, compared to parallel fault and parallel pattern simulators, ZAMBEZI offers either the best, or very close to the best, uniprocessor performance. ZAMBEZI also offers superior performance when parallelized.
AbstractList Sequential circuit fault simulators use the multiple bits in a computer data word to accelerate simulation. We introduce, and implement, a new sequential circuit fault simulator, a parallel pattern parallel fault simulator, ZAMBEZI, which simultaneously simulates multiple faults with multiple vectors in one data word. ZAMBEZI is developed by enhancing the control flow, of existing parallel pattern algorithms. For a very wide range of benchmark circuits, compared to parallel fault and parallel pattern simulators, ZAMBEZI offers either the best, or very close to the best, uniprocessor performance. ZAMBEZI also offers superior performance when parallelized.
Author Vinnakota, B.
Amin, M.B.
Author_xml – sequence: 1
  givenname: M.B.
  surname: Amin
  fullname: Amin, M.B.
  organization: Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
– sequence: 2
  givenname: B.
  surname: Vinnakota
  fullname: Vinnakota, B.
BookMark eNpFULFOwzAUtKBIlNIPgCk_kPJeHPvZbKUKUKkVA4WhS_USHMnITUviDPw9kQriljvd6W64KzFqDo0T4gZhhgj27n1TvG5maK2eKQRj4UyMM0kqRVDyXEwtGTBoNEnIaSTGQ0emgJouxbTrPmGAUsZSPhbr7Xz9UGyX9wknR245BBcGEaNrm3-j5j7EpHNfvWui55BUvq16H_8Cv-8Dx0N7LS5qDp2b_vJEvD0Wm8Vzunp5Wi7mq9Qj5DElKY3OqVJgKlVbKlERAJVGQ41KMw2ZqUnqXOos_8DKZlYxZ9oSM2alnIjb0653zu2Ord9z-707fSF_AJUCUPk
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/VTEST.1996.510890
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Xplore
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Xplore
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Computer Science
EISSN 2375-1053
EndPage 443
ExternalDocumentID 510890
GroupedDBID 23M
29O
6IE
6IL
6IN
ABLEC
ADZIZ
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
CHZPO
IEGSK
JC5
M43
OCL
RIE
RIL
ID FETCH-LOGICAL-i104t-7338647c508c5f97b157007b860f156a747c8f73643624d1c9295aa2697aa12b3
IEDL.DBID RIE
ISBN 9780818673047
0818673044
ISSN 1093-0167
IngestDate Wed Jun 26 19:22:22 EDT 2024
IsPeerReviewed false
IsScholarly true
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i104t-7338647c508c5f97b157007b860f156a747c8f73643624d1c9295aa2697aa12b3
PageCount 6
ParticipantIDs ieee_primary_510890
PublicationCentury 1900
PublicationDate 19960000
PublicationDateYYYYMMDD 1996-01-01
PublicationDate_xml – year: 1996
  text: 19960000
PublicationDecade 1990
PublicationTitle Proceedings of 14th VLSI Test Symposium
PublicationTitleAbbrev VTEST
PublicationYear 1996
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0000558974
ssj0020540
Score 1.4179263
Snippet Sequential circuit fault simulators use the multiple bits in a computer data word to accelerate simulation. We introduce, and implement, a new sequential...
SourceID ieee
SourceType Publisher
StartPage 438
SubjectTerms Acceleration
Circuit faults
Circuit simulation
Circuit testing
Computational modeling
Computer science
Computer simulation
Logic testing
Parallel processing
Sequential circuits
Title ZAMBEZI: a parallel pattern parallel fault sequential circuit fault simulator
URI https://ieeexplore.ieee.org/document/510890
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3PT4MwGG10J71M54y_w8ErjAJtqTc1W6bJjImbWXZZ-jMhMmYmXPzrbQvb1HjwVgoJoRT6vq_vvQ-A64hyBUMNfY0k8RMrk2EqDn3GOBIplgb1OpbvEx5OkscpmjY-204Lo5Ry5DMV2Kbby5dLUdlUWc_Mn5Sa-HyXUFpLtTbplBChlFok08RaFom4jU5LT4OYOOtHa95mwvekMd5ZH5Nmt9Nc3Hsd91_GVsKHg_puP6quuEVn0K7V3B_Oq9ByTd6CquSB-Pzl5PjP5zkA3a26z3verFuHYEcVHdBel3fwmq-9A_a_eRUegdHsdnTXnz3ceMyzfuF5rnLTsGKgYtuhWZWXXs3PNv-O3BPZSlRZuT6RLWy5sOWqCyaD_vh-6De1GPzMBGylT0woixMiDJ4TSFPCoTXGJzzF5kUjzExUIlJNYgNwcJRIKAzsQoxFmBLGYMTjY9AqloU6AR7WEdEESsKwSBIasyhmREqoOZIikuEp6Nihmr_XdhvzepTO_uw9B3s1jdrmRC5Aq1xV6tKghJJfufnxBYdwtDg
link.rule.ids 310,311,783,787,792,793,799,4057,4058,27937,55086
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1NT4MwGG7MPKiX6ZzxWw5eYRRoC97UbNl0W0xkZtll6RcJEZmZcPHX2xa2qfHgrRQSwkuhz_vxPC8A117EJHQTaCdIEDvQNBkqfdemlCEeYqFQr6nyHeP-JHiYommts224MFJKU3wmHT00uXyx4KUOlXXU-gkj5Z9vK1gd4oqstQ6ouAiFkcYytbelsYhJdeoCNYiJEX_U8m3KgQ9q6Z3VManznerizkvcfY41iQ871f1-9F0x206vWfG5P4xaoa42eXXKgjn885eW4z-faB-0N_w-62m9cx2ALZm3QHPV4MGqv_cW2PumVngIRrPb0V13NrixqKUVw7NMZmqg6UD5ZiKhZVZYVYW2-ntkFk-XvEyL1Yn0TTcMWyzbYNLrxvd9u-7GYKfKZStsopxZHBCuTM9REhEGtTQ-YSFWrxphqvwSHibEVxAHe4GAXAEvRKmHI0Ip9Jh_BBr5IpfHwMKJRxICBaGYB0HkU8-nRAiYMCS4J9wT0NKmmr9Xghvzykqnf85egZ1-PBrOh4Px4xnYrYqqdYTkHDSKZSkvFGYo2KVZK18pE7eD
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=Proceedings+of+14th+VLSI+Test+Symposium&rft.atitle=ZAMBEZI%3A+a+parallel+pattern+parallel+fault+sequential+circuit+fault+simulator&rft.au=Amin%2C+M.B.&rft.au=Vinnakota%2C+B.&rft.date=1996-01-01&rft.pub=IEEE&rft.isbn=9780818673047&rft.issn=1093-0167&rft.eissn=2375-1053&rft.spage=438&rft.epage=443&rft_id=info:doi/10.1109%2FVTEST.1996.510890&rft.externalDocID=510890
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1093-0167&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1093-0167&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1093-0167&client=summon