Proton irradiation qualification of the vSWIR InGaAs imaging sensor for the VEM and VenSpec-M instruments on VERITAS and EnVision
The first NASA spacecraft to visit and explore planet Venus since the 1990s will be the Venus Emissivity, Radio science, InSAR, Topography, And Spectroscopy mission (VERITAS) orbiter. The Venus Emissivity Mapper (VEM) onboard the spacecraft is designed for surface mapping of Venus within dedicated a...
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Published in | Proceedings of SPIE, the international society for optical engineering Vol. 13144; pp. 131440H - 131440H-13 |
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Main Authors | , , , , , , , , , , , , , , , |
Format | Conference Proceeding |
Language | English |
Published |
SPIE
03.10.2024
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Abstract | The first NASA spacecraft to visit and explore planet Venus since the 1990s will be the Venus Emissivity, Radio science, InSAR, Topography, And Spectroscopy mission (VERITAS) orbiter. The Venus Emissivity Mapper (VEM) onboard the spacecraft is designed for surface mapping of Venus within dedicated atmospheric spectral windows. The instrument will provide global coverage for the detection of thermal emissions like volcanic activity, surface rock composition, water abundance, cloud formation and their dynamics by observing 14 narrow filter bands in the near-infrared to short-wave infrared (NIR, SWIR) range of 790 nm to 1510 nm. An almost identical instrument will be part of ESA’s recently announced EnVision mission to Venus, the VenSpec-M in the Venus Spectroscopy Suite (VenSpec). The utilized photodetector for both missions will be an InGaAs type imaging sensor with integrated thermoelectric (TE) cooling, comprising a 640x512 pixel array with 20 μm pixel pitch.
In general, a space environmental qualification of electronic devices combines its susceptibility to radiation induced single event effects (SEE) and the evaluation of permanent degradation effects due to total ionizing dose (TID) and displacement damage dose (DDD). Following a successful qualification test with heavy-ions focusing on SEE, our imaging sensor was subject to a proton irradiation test campaign at Helmholtz-Zentrum Berlin (HZB) for combined TID and DDD testing. To track the sensor evolution, we subdivided the proton fluence into 10 irradiation steps with intermediate measurements. The collected data provide information on the evolution of dark current, light sensitivity and pixels showing randomtelegraph- noise (RTN) on the sensor during a 5-year mission. |
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AbstractList | The first NASA spacecraft to visit and explore planet Venus since the 1990s will be the Venus Emissivity, Radio science, InSAR, Topography, And Spectroscopy mission (VERITAS) orbiter. The Venus Emissivity Mapper (VEM) onboard the spacecraft is designed for surface mapping of Venus within dedicated atmospheric spectral windows. The instrument will provide global coverage for the detection of thermal emissions like volcanic activity, surface rock composition, water abundance, cloud formation and their dynamics by observing 14 narrow filter bands in the near-infrared to short-wave infrared (NIR, SWIR) range of 790 nm to 1510 nm. An almost identical instrument will be part of ESA’s recently announced EnVision mission to Venus, the VenSpec-M in the Venus Spectroscopy Suite (VenSpec). The utilized photodetector for both missions will be an InGaAs type imaging sensor with integrated thermoelectric (TE) cooling, comprising a 640x512 pixel array with 20 μm pixel pitch.
In general, a space environmental qualification of electronic devices combines its susceptibility to radiation induced single event effects (SEE) and the evaluation of permanent degradation effects due to total ionizing dose (TID) and displacement damage dose (DDD). Following a successful qualification test with heavy-ions focusing on SEE, our imaging sensor was subject to a proton irradiation test campaign at Helmholtz-Zentrum Berlin (HZB) for combined TID and DDD testing. To track the sensor evolution, we subdivided the proton fluence into 10 irradiation steps with intermediate measurements. The collected data provide information on the evolution of dark current, light sensitivity and pixels showing randomtelegraph- noise (RTN) on the sensor during a 5-year mission. |
Author | Marcq, E. Alemanno, G. Rosas Ortiz, Y. M. Peter, G. Hagelschuer, T. Del Togno, S. Säuberlich, T. Walter, I. Vandaele, A. C. Pohl, A. Arcos Carrasco, C. Wendler, D. Pertenais, M. Westerdorff, K. Helbert, J. Dern, P. |
Author_xml | – sequence: 1 givenname: A. surname: Pohl fullname: Pohl, A. organization: Deutsches Zentrum für Luft- und Raumfahrt e.V. (Germany) – sequence: 2 givenname: S. surname: Del Togno fullname: Del Togno, S. organization: Deutsches Zentrum für Luft- und Raumfahrt e.V. (Germany) – sequence: 3 givenname: Y. M. surname: Rosas Ortiz fullname: Rosas Ortiz, Y. M. organization: Deutsches Zentrum für Luft- und Raumfahrt e.V. (Germany) – sequence: 4 givenname: K. surname: Westerdorff fullname: Westerdorff, K. organization: Deutsches Zentrum für Luft- und Raumfahrt e.V. (Germany) – sequence: 5 givenname: C. surname: Arcos Carrasco fullname: Arcos Carrasco, C. organization: Deutsches Zentrum für Luft- und Raumfahrt e.V. (Germany) – sequence: 6 givenname: D. surname: Wendler fullname: Wendler, D. organization: Deutsches Zentrum für Luft- und Raumfahrt e.V. (Germany) – sequence: 7 givenname: J. surname: Helbert fullname: Helbert, J. organization: Deutsches Zentrum für Luft- und Raumfahrt e.V. (Germany) – sequence: 8 givenname: G. surname: Peter fullname: Peter, G. organization: Deutsches Zentrum für Luft- und Raumfahrt e.V. (Germany) – sequence: 9 givenname: I. surname: Walter fullname: Walter, I. organization: Deutsches Zentrum für Luft- und Raumfahrt e.V. (Germany) – sequence: 10 givenname: P. surname: Dern fullname: Dern, P. organization: Deutsches Zentrum für Luft- und Raumfahrt e.V. (Germany) – sequence: 11 givenname: M. surname: Pertenais fullname: Pertenais, M. organization: Deutsches Zentrum für Luft- und Raumfahrt e.V. (Germany) – sequence: 12 givenname: G. surname: Alemanno fullname: Alemanno, G. organization: Deutsches Zentrum für Luft- und Raumfahrt e.V. (Germany) – sequence: 13 givenname: T. surname: Hagelschuer fullname: Hagelschuer, T. organization: Deutsches Zentrum für Luft- und Raumfahrt e.V. (Germany) – sequence: 14 givenname: T. surname: Säuberlich fullname: Säuberlich, T. organization: Deutsches Zentrum für Luft- und Raumfahrt e.V. (Germany) – sequence: 15 givenname: E. surname: Marcq fullname: Marcq, E. organization: LATMOS/IPSL, UVSQ Univ. Paris-Saclay, Sorbonne Univ., CNRS (France) – sequence: 16 givenname: A. C. surname: Vandaele fullname: Vandaele, A. C. organization: Royal Belgian Institute for Space Aeronomy (Belgium) |
BookMark | eNotkEFrwkAQhRdqoWq99BfsuRA7m7jZ5CiS2oDSopL2Fmazu7pFNzYbvfefN1YPw8zAx3u8NyA9VztNyBODMWNMvLBwHEGYABd3ZJSKhHEGsUgnCeuRPoRCBCKJvx7IwPtv6EAu0j75_WjqtnbUNg0qi63t7p8T7q2x1fWrDW13mp7Xn_mK5m6OU0_tAbfWbanXztcNNd1cmCJbUnSKFtqtj7oKltQ63zang3atp51Wka3yzXT9D2WusL4zeCT3Bvdej257SDav2Wb2Fize5_lsugh2AkSgpGTIjZZMcSNBpoJDzJMkiquJlKYKEQGwMhEDwdVECiUB01imBnkEmERD8nyV9Uery2NTV1qrLoMvGZSX_koWlrf-oj_PE2Tf |
ContentType | Conference Proceeding |
Copyright | COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only. |
Copyright_xml | – notice: COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only. |
DOI | 10.1117/12.3028057 |
DatabaseTitleList | |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
Editor | Strojnik, Marija Helbert, Jörn |
Editor_xml | – sequence: 1 givenname: Marija surname: Strojnik fullname: Strojnik, Marija organization: Optical Research (Mexico) – sequence: 2 givenname: Jörn surname: Helbert fullname: Helbert, Jörn organization: Deutsches Zentrum für Luft- und Raumfahrt e.V. (Germany) |
EndPage | 131440H-13 |
ExternalDocumentID | 10_1117_12_3028057 |
GroupedDBID | 29O 4.4 5SJ ACGFS ALMA_UNASSIGNED_HOLDINGS EBS F5P FQ0 R.2 RNS RSJ SPBNH |
ID | FETCH-LOGICAL-h707-dbb1a5feb1d5fb0b9750658836c4bbfc2aa00acf31075d4b7db0a96b9fa530a83 |
ISBN | 9781510679481 1510679480 |
ISSN | 0277-786X |
IngestDate | Fri Nov 22 06:57:53 EST 2024 |
IsPeerReviewed | false |
IsScholarly | true |
Language | English |
LinkModel | OpenURL |
MergedId | FETCHMERGED-LOGICAL-h707-dbb1a5feb1d5fb0b9750658836c4bbfc2aa00acf31075d4b7db0a96b9fa530a83 |
Notes | Conference Date: 2024-08-18|2024-08-23 Conference Location: San Diego, California, United States |
ParticipantIDs | spie_proceedings_10_1117_12_3028057 |
PublicationCentury | 2000 |
PublicationDate | 20241003 |
PublicationDateYYYYMMDD | 2024-10-03 |
PublicationDate_xml | – month: 10 year: 2024 text: 20241003 day: 3 |
PublicationDecade | 2020 |
PublicationTitle | Proceedings of SPIE, the international society for optical engineering |
PublicationYear | 2024 |
Publisher | SPIE |
Publisher_xml | – name: SPIE |
SSID | ssj0028579 |
Score | 2.270058 |
Snippet | The first NASA spacecraft to visit and explore planet Venus since the 1990s will be the Venus Emissivity, Radio science, InSAR, Topography, And Spectroscopy... |
SourceID | spie |
SourceType | Publisher |
StartPage | 131440H |
Title | Proton irradiation qualification of the vSWIR InGaAs imaging sensor for the VEM and VenSpec-M instruments on VERITAS and EnVision |
URI | http://www.dx.doi.org/10.1117/12.3028057 |
Volume | 13144 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1Lj9MwELa65QInHot4yxLcooS8H8cKCi0QWG1CdzlVfoWtBMmqKRy48Qf5TYztPNylB-ASte7UaTqf7fF45huEnvkZNFc8sSvOMhvsfxhzMaMw8Ah8IxNZ4Mnc4fx9vPgYvjmPzieTX0bU0rcdddiPg3kl_6NVaAO9yizZf9Ds0Ck0wGvQL1xBw3C9YvweXGdOhkYVj1GcLFVoozQlN3uOvtYIzWwutfdajESEJmygT0m0sdluJWmBAofKu6w6314fU_C9OFuewuzymsxaa_NV1zpqYU8Mt-gjF1fzXJ1NrEQty9zbuYx830m2hlqfUqxgF1nOCiU0r1cqzX2Yq5sLHT_gDLa2-GKVzWdVK9wqhubTpiWt9QFGgPKFf3KsfPjsTPFA8GaruSffOqaTww9VuFxghIYs9ze-YKdID1ioy71086U8jU5SVRhxnNwDLwyNCVq9dxfGet-12Dol9sCKojgJfCeQh9CaTPsKQ7feRyVrz193QkfoCCyvKbo2e5m_KwYHQBpp7sf-h8pEw_5Bev6x4cE6Ll3o-Pl4dxlveLkRhglU3kTHY3IoHpF3C01EfRvdMHgt76CfGkXYQBHeQxFuKgwIwQpFWKMIdyjCGkUYUKRkAEUYAIIHFGEDRRj66lCkhHoUHaPy1bx8sbC7Wh_2ReImNqfUI1EFhgOPKurSDAxZsI3TIGYhpRXzCXFdwirYjCQRD2nCqUuymGYViQKXpMFdNK2bWtxD2GfMyzwRwyTkg2BCIs6g65BxEiSMp_fRU_kXrseB267_1OCDv5J6iK6PaH2EpvDw4jEYqTv6pNP9b42CjVM |
linkProvider | EBSCOhost |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=Proceedings+of+SPIE%2C+the+international+society+for+optical+engineering&rft.atitle=Proton+irradiation+qualification+of+the+vSWIR+InGaAs+imaging+sensor+for+the+VEM+and+VenSpec-M+instruments+on+VERITAS+and+EnVision&rft.au=Pohl%2C+A.&rft.au=Del+Togno%2C+S.&rft.au=Rosas+Ortiz%2C+Y.+M.&rft.au=Westerdorff%2C+K.&rft.date=2024-10-03&rft.pub=SPIE&rft.isbn=9781510679481&rft.issn=0277-786X&rft.volume=13144&rft.spage=131440H&rft.epage=131440H-13&rft_id=info:doi/10.1117%2F12.3028057&rft.externalDocID=10_1117_12_3028057 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0277-786X&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0277-786X&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0277-786X&client=summon |