Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs

• Published in: Proceedings / IEEE International On-Line Testing Symposium pp. 1 - 4
• Main Authors: Azais, F., Bernard, S., Comte, M., Deveautour, B., Dupuis, S., Badawi, H. El, Flottes, M.-L., Girard, P., Kerzerho, V., Latorre, L., Lefevre, F., Rouzeyre, B., Valea, E., Vayssadel, T., Virazel, A.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.07.2020
• Subjects: AxC; Ciphers; Encryption; ETI; Fault tolerance; Integrated circuits; Machine Learning; RF signals; RF testing; scan encryption; Security and test; Tunneling magnetoresistance

Systems on a chip have seen their surface area increased by a factor of 10 and their consumption multiplied by 5 during the last ten years. Each technological node that enabled this integration has also added new constraints challenging the overall system reliability. In addition, the integration of...