APA (7th ed.) Citation

Azais, F., Bernard, S., Comte, M., Deveautour, B., Dupuis, S., Badawi, H. E., . . . Virazel, A. (2020, July). Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. Proceedings / IEEE International On-Line Testing Symposium, 1-4. https://doi.org/10.1109/IOLTS50870.2020.9159723

Chicago Style (17th ed.) Citation

Azais, F., et al. "Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs." Proceedings / IEEE International On-Line Testing Symposium Jul. 2020: 1-4. https://doi.org/10.1109/IOLTS50870.2020.9159723.

MLA (9th ed.) Citation

Azais, F., et al. "Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs." Proceedings / IEEE International On-Line Testing Symposium, Jul. 2020, pp. 1-4, https://doi.org/10.1109/IOLTS50870.2020.9159723.