Cabanillas, E., Layer, C., & Kafal, M. (2017, October). On the phase analysis of multi-carrier signals for high-precision fault detection by reflectometry. 2017 IEEE SENSORS, 1-3. https://doi.org/10.1109/ICSENS.2017.8234182
Chicago Style (17th ed.) CitationCabanillas, Esteban, Christophe Layer, and Moussa Kafal. "On the Phase Analysis of Multi-carrier Signals for High-precision Fault Detection by Reflectometry." 2017 IEEE SENSORS Oct. 2017: 1-3. https://doi.org/10.1109/ICSENS.2017.8234182.
MLA (9th ed.) CitationCabanillas, Esteban, et al. "On the Phase Analysis of Multi-carrier Signals for High-precision Fault Detection by Reflectometry." 2017 IEEE SENSORS, Oct. 2017, pp. 1-3, https://doi.org/10.1109/ICSENS.2017.8234182.
Warning: These citations may not always be 100% accurate.