A new method for the determination of the minority carrier lifetime based on a biased OCVD technique [solar cells]

• Published in: Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997 pp. 191 - 193
• Main Authors: Bruno, C.J., Martinez Bogado, M.G., Pla, J.C., Duran, J.C.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 01.01.1997
• Subjects: Atomic measurements; Charge carrier lifetime; Energy measurement; Gallium arsenide; Light emitting diodes; Light sources; Lighting; Performance evaluation; Photovoltaic cells; Test equipment

A new simple method for the determination of the solar cell minority carrier lifetime (/spl tau/), based on a biased OCVD technique, is analyzed. In this case, the excitation is given by a pulsed light source (time dependent contribution) plus a continuous illumination (continuous forward bias). Und...