A new method for the determination of the minority carrier lifetime based on a biased OCVD technique [solar cells]

A new simple method for the determination of the solar cell minority carrier lifetime (/spl tau/), based on a biased OCVD technique, is analyzed. In this case, the excitation is given by a pulsed light source (time dependent contribution) plus a continuous illumination (continuous forward bias). Und...

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Bibliographic Details
Published inConference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997 pp. 191 - 193
Main Authors Bruno, C.J., Martinez Bogado, M.G., Pla, J.C., Duran, J.C.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.01.1997
Subjects
Atomic measurements
Charge carrier lifetime
Energy measurement
Gallium arsenide
Light emitting diodes
Light sources
Lighting
Performance evaluation
Photovoltaic cells
Test equipment
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Summary:A new simple method for the determination of the solar cell minority carrier lifetime (/spl tau/), based on a biased OCVD technique, is analyzed. In this case, the excitation is given by a pulsed light source (time dependent contribution) plus a continuous illumination (continuous forward bias). Under appropriate conditions, this configuration produces an exponential decay with a time constant which depends on the bias. This constant decreases monotonously as a function of bias and allows one to determine an effective /spl tau/ for the base region. Inexpensive test equipment has been developed which basically consists of two sets of high-efficiency GaAs LEDs, which provide both light contributions. Measurements have been performed on crystalline silicon solar cells elaborated in the Argentine Atomic Energy Commission. Experimental results show good agreement with the theoretical model and with numerical PC-1D simulations.
ISBN:9780780337671
0780337670
ISSN:0160-8371
DOI:10.1109/PVSC.1997.654061