Mechanochemically prepared SrFCl nanophosphor co-doped with Yb 3+ and Er 3+ for detecting ionizing radiation by upconversion luminescence
We report a novel method for detecting ionizing radiation by employing the phenomenon of upconversion luminescence. Nanocrystalline SrFCl:Yb 3+ /Er 3+ was prepared by ball-milling and characterized by powder X-ray diffraction (XRD), transmission electron microscopy (TEM), and X-ray photoelectron spe...
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Published in | Nanoscale Vol. 9; no. 41; pp. 15958 - 15966 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
England
26.10.2017
|
Online Access | Get full text |
ISSN | 2040-3364 2040-3372 |
DOI | 10.1039/C7NR05108E |
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Summary: | We report a novel method for detecting ionizing radiation by employing the phenomenon of upconversion luminescence. Nanocrystalline SrFCl:Yb
3+
/Er
3+
was prepared by ball-milling and characterized by powder X-ray diffraction (XRD), transmission electron microscopy (TEM), and X-ray photoelectron spectroscopy (XPS). The photoluminescence properties of nanocrystalline SrFCl:Yb
3+
, SrFCl:Er
3+
and SrFCl:Yb
3+
/Er
3+
before and after X-irradiation were investigated. The results demonstrate that both Yb
3+
and Er
3+
ions in the SrFCl host are reduced to their divalent state upon X-ray exposure. Under 980 nm infrared excitation, SrFCl:Yb
3+
/Er
3+
nanocrystals displayed efficient upconversion luminescence. The upconversion luminescence intensity gradually decreased with increasing X-irradiation in a double exponential fashion with rate constants of
k
1
= 0.08 Gy
−1
and
k
2
= 0.01 Gy
−1
. In comparison with other X-ray storage phosphors, the present system shows a much higher stability of stored information since it is not subject to photobleaching in the read-out process. This is the first report on detecting ionizing radiation by upconversion luminescence, with the potential for improved read-out performance over traditional storage phosphors. Possible applications of the present phosphor include bioimaging and
in vivo
cell-level X-ray dose monitoring. |
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ISSN: | 2040-3364 2040-3372 |
DOI: | 10.1039/C7NR05108E |