X-ray topography contrast from edge dislocations in ZnGeP 2 single crystals

• Published in: Journal of applied crystallography Vol. 48; no. 4; pp. 1228 - 1233
• Main Authors: Okunev, A. O., Verozubova, G. A.
• Format: Journal Article
• Language: English
• Published: 01.08.2015

X-ray topography images in the form of contrast rosettes from edge dislocations of the \{ {\bar 110} \}\langle {110} \rangle slip system in ZnGeP 2 single crystals, obtained under different diffraction conditions, are identified and interpreted. To analyze and model the dislocation images, a semi-ph...