Electrical and Optical Characterization of GeON Layers with high-k Gate Stacks on Germanium for Future MOSFETs

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Published inMeeting abstracts (Electrochemical Society) Vol. MA2012-01; no. 16; p. 690
Main Authors Murad, Shahjahan N., Baine, Paul T., Montgomery, John H., McNeill, David W., Mitchell, S.J.N., Armstrong, B.M., Modreanu, Mircea
Format Journal Article
LanguageEnglish
Published 15.02.2012
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Author McNeill, David W.
Murad, Shahjahan N.
Armstrong, B.M.
Montgomery, John H.
Mitchell, S.J.N.
Baine, Paul T.
Modreanu, Mircea
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Title Electrical and Optical Characterization of GeON Layers with high-k Gate Stacks on Germanium for Future MOSFETs
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