Photo-Assisted Ferroelectric Domain Control for α-In 2 Se 3 Artificial Synapses Inspired by Spontaneous Internal Electric Fields
α-In Se semiconductor crystals realize artificial synapses by tuning in-plane and out-of-plane ferroelectricity with diverse avenues of electrical and optical pulses. While the electrically induced ferroelectricity of α-In Se shows synaptic memory operation, the optically assisted synaptic plasticit...
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Published in | Small (Weinheim an der Bergstrasse, Germany) Vol. 20; no. 22; p. e2307346 |
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Main Authors | , , , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Germany
01.05.2024
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Subjects | |
Online Access | Get full text |
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Summary: | α-In
Se
semiconductor crystals realize artificial synapses by tuning in-plane and out-of-plane ferroelectricity with diverse avenues of electrical and optical pulses. While the electrically induced ferroelectricity of α-In
Se
shows synaptic memory operation, the optically assisted synaptic plasticity in α-In
Se
has also been preferred for polarization flipping enhancement. Here, the synaptic memory behavior of α-In
Se
is demonstrated by applying electrical gate voltages under white light. As a result, the induced internal electric field is identified at a polarization flipped conductance channel in α-In
Se
/hexagonal boron nitride (hBN) heterostructure ferroelectric field effect transistors (FeFETs) under white light and discuss the contribution of this built-in electric field on synapse characterization. The biased dipoles in α-In
Se
toward potentiation polarization direction by an enhanced internal built-in electric field under illumination of white light lead to improvement of linearity for long-term depression curves with proper electric spikes. Consequently, upon applying appropriate electric spikes to α-In
Se
/hBN FeFETs with illuminating white light, the recognition accuracy values significantly through the artificial learning simulation is elevated for discriminating hand-written digit number images. |
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ISSN: | 1613-6810 1613-6829 |
DOI: | 10.1002/smll.202307346 |