Spin-Polarized Positron Annihilation Measurement on Ga Vacancies in p-type GaN

Nitrogen-implanted p-type GaN films have been investigated through the Doppler broadening of annihilation radiation (DBAR) measurements with spin-polarized positrons and magnetization (M—H) measurements. The DBAR spectra showed asymmetry upon magnetic-field reversal at 300 K, while no asymmetry appe...

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Published inE-journal of surface science and nanotechnology Vol. 16; pp. 347 - 350
Main Authors Kawasuso, Atsuo, Sakai, Seiji, Miyashita, Atsumi, Maekawa, Masaki
Format Journal Article
LanguageEnglish
Published Tokyo The Japan Society of Vacuum and Surface Science 28.07.2018
Japan Science and Technology Agency
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1348-0391
DOI10.1380/ejssnt.2018.347

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Abstract Nitrogen-implanted p-type GaN films have been investigated through the Doppler broadening of annihilation radiation (DBAR) measurements with spin-polarized positrons and magnetization (M—H) measurements. The DBAR spectra showed asymmetry upon magnetic-field reversal at 300 K, while no asymmetry appeared at 30 K. This result indicates that excess electron spins at Ga vacancies are aligned under the application of magnetic field at 300 K, but such spin ordering vanishes at low temperatures. No hysteresis was found in M—H curves both at 10 K and 300 K. This means that no macroscopic magnetism appears even though excess electron spins at Ga vacancies are introduced. [DOI: 10.1380/ejssnt.2018.347]
AbstractList Nitrogen-implanted p-type GaN films have been investigated through the Doppler broadening of annihilation radiation (DBAR) measurements with spin-polarized positrons and magnetization (M—H) measurements. The DBAR spectra showed asymmetry upon magnetic-field reversal at 300 K, while no asymmetry appeared at 30 K. This result indicates that excess electron spins at Ga vacancies are aligned under the application of magnetic field at 300 K, but such spin ordering vanishes at low temperatures. No hysteresis was found in M—H curves both at 10 K and 300 K. This means that no macroscopic magnetism appears even though excess electron spins at Ga vacancies are introduced. [DOI: 10.1380/ejssnt.2018.347]
Author Miyashita, Atsumi
Maekawa, Masaki
Kawasuso, Atsuo
Sakai, Seiji
Author_xml – sequence: 1
  fullname: Kawasuso, Atsuo
  organization: Takasaki Advanced Radiation Research Institute, National Institutes for Quantum and Radiological Science and Technology
– sequence: 1
  fullname: Sakai, Seiji
  organization: Takasaki Advanced Radiation Research Institute, National Institutes for Quantum and Radiological Science and Technology
– sequence: 1
  fullname: Miyashita, Atsumi
  organization: Takasaki Advanced Radiation Research Institute, National Institutes for Quantum and Radiological Science and Technology
– sequence: 1
  fullname: Maekawa, Masaki
  organization: Takasaki Advanced Radiation Research Institute, National Institutes for Quantum and Radiological Science and Technology
BookMark eNp9kE1PAjEQhhuDiYCevW7ieaHdtvtxkxBFE0QSP65N6c5KydJd23LAX29xlRgPXtrO9H1mkmeAeqYxgNAlwSNCczyGjXPGjxJM8hFl2QnqE8ryGNOC9H69z9DAuQ3GNKNZ2keLp1abeNnU0uoPKKNl47S3jYkmxui1rqXXoXgA6XYWtmB8FMqZjF6lkkZpcJE2URv7fQuhvThHp5WsHVx830P0cnvzPL2L54-z--lkHqs0wT6ueLEiDDCjrAClgNB0VVGc5hJWmKccsgKwrDIJBSQFLitFU8qLssw4y1lV0iG66ua2tnnfgfNi0-ysCStFklCSE84SHlLjLqVs45yFSrRWb6XdC4LFQZropImDNBGkBYL_IZT2Xw68lbr-h7vuuI3z8g2Oe6T1WtXwkyepwIcjIMcvtZZWgKGf5giMxA
CitedBy_id crossref_primary_10_1016_j_nimb_2020_08_001
crossref_primary_10_35848_1347_4065_ab9654
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ContentType Journal Article
Copyright 2018 The Japan Society of Vacuum and Surface Science
Copyright Japan Science and Technology Agency 2018
Copyright_xml – notice: 2018 The Japan Society of Vacuum and Surface Science
– notice: Copyright Japan Science and Technology Agency 2018
DBID AAYXX
CITATION
7SR
7U5
8FD
JG9
L7M
DOI 10.1380/ejssnt.2018.347
DatabaseName CrossRef
Engineered Materials Abstracts
Solid State and Superconductivity Abstracts
Technology Research Database
Materials Research Database
Advanced Technologies Database with Aerospace
DatabaseTitle CrossRef
Materials Research Database
Engineered Materials Abstracts
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
DatabaseTitleList Materials Research Database

DeliveryMethod fulltext_linktorsrc
Discipline Chemistry
EISSN 1348-0391
EndPage 350
ExternalDocumentID 10_1380_ejssnt_2018_347
article_ejssnt_16_0_16_347_article_char_en
GroupedDBID 29G
2WC
5GY
ADBBV
ADDVE
ALMA_UNASSIGNED_HOLDINGS
BCNDV
CS3
DU5
E3Z
EBS
EJD
GROUPED_DOAJ
GX1
HH5
JSF
JSH
KQ8
M~E
OK1
OVT
RJT
RNS
RZJ
TR2
XSB
AAYXX
CITATION
7SR
7U5
8FD
JG9
L7M
ID FETCH-LOGICAL-c620t-f59b14e04349ecce136bf3068aeb0565e79e0af7ae9e290dfc36359dd75484fd3
ISSN 1348-0391
IngestDate Mon Jun 30 10:02:26 EDT 2025
Tue Jul 01 02:37:18 EDT 2025
Thu Apr 24 22:51:51 EDT 2025
Wed Sep 03 06:22:43 EDT 2025
IsDoiOpenAccess true
IsOpenAccess true
IsPeerReviewed true
IsScholarly true
Language English
License https://creativecommons.org/licenses/by/4.0/deed.ja
LinkModel OpenURL
MergedId FETCHMERGED-LOGICAL-c620t-f59b14e04349ecce136bf3068aeb0565e79e0af7ae9e290dfc36359dd75484fd3
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
OpenAccessLink http://dx.doi.org/10.1380/ejssnt.2018.347
PQID 2231815425
PQPubID 1996353
PageCount 4
ParticipantIDs proquest_journals_2231815425
crossref_primary_10_1380_ejssnt_2018_347
crossref_citationtrail_10_1380_ejssnt_2018_347
jstage_primary_article_ejssnt_16_0_16_347_article_char_en
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2018-07-28
PublicationDateYYYYMMDD 2018-07-28
PublicationDate_xml – month: 07
  year: 2018
  text: 2018-07-28
  day: 28
PublicationDecade 2010
PublicationPlace Tokyo
PublicationPlace_xml – name: Tokyo
PublicationTitle E-journal of surface science and nanotechnology
PublicationTitleAlternate e-J. Surf. Sci. Nanotechnol.
PublicationYear 2018
Publisher The Japan Society of Vacuum and Surface Science
Japan Science and Technology Agency
Publisher_xml – name: The Japan Society of Vacuum and Surface Science
– name: Japan Science and Technology Agency
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28
29
30
31
10
32
11
12
13
14
15
16
17
18
19
1
2
3
4
5
6
7
8
9
20
21
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– ident: 3
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– ident: 20
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– ident: 27
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– ident: 10
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– ident: 16
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– ident: 22
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– ident: 23
  doi: 10.1103/PhysRevB.83.100406
– ident: 6
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– ident: 30
  doi: 10.1103/PhysRevLett.79.3030
– ident: 11
  doi: 10.1088/0953-8984/22/21/216004
– ident: 25
  doi: 10.1088/1742-6596/505/1/012033
– ident: 5
  doi: 10.1063/1.3609964
– ident: 9
  doi: 10.1039/C4RA11658E
– ident: 4
  doi: 10.1063/1.3679560
– ident: 2
  doi: 10.1103/PhysRevB.72.045336
– ident: 18
  doi: 10.1063/1.2833432
– ident: 32
  doi: 10.1103/PhysRevLett.100.117204
SSID ssj0037376
Score 2.1027515
Snippet Nitrogen-implanted p-type GaN films have been investigated through the Doppler broadening of annihilation radiation (DBAR) measurements with spin-polarized...
SourceID proquest
crossref
jstage
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 347
SubjectTerms Asymmetry
Electron spin
Electrons
Gallium nitride
Ion implantation methods
Magnetism
Positron annihilation
Positron spectroscopy
Positrons
Vacancies
Title Spin-Polarized Positron Annihilation Measurement on Ga Vacancies in p-type GaN
URI https://www.jstage.jst.go.jp/article/ejssnt/16/0/16_347/_article/-char/en
https://www.proquest.com/docview/2231815425
Volume 16
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
ispartofPNX e-Journal of Surface Science and Nanotechnology, 2018/07/28, Vol.16, pp.347-350
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3da9swEBdZN9hexj5Ztq74YQ-Dosy2ZNl-DGVL2UgotB15M5IsrU6HUhqHsf4L-6d3smzVaVro9iISfRxCdzr9dD7dIfRB2MwBMi9xrEuGackSzFPKsJBMcBHphGX27fB0xg5P6dd5Mh8M_vS8lta1GMmrW9-V_A9XoQ74al_J_gNnPVGogN_AXyiBw1Dei8fHF5XBR_ZyWl0BcDyyDliXwM6xMdVZ5bzc9qfXVkD7ZWDC979z2eTkdS7kuLHCTvhsw0iPeyElYLjmNhRtqwesrd1ws6y3zPJTrs75L-4eAa0AnHoDDj93ea-PVbXwtdPqt83l5ADsuIal803fgMxqvVp2Lcu-eSLKrN0z7mtUQu0bPpeSa6RuqevUcF-PEheGsz2SiYtNu6XtSeMeqRZA07rFRtnIj-vH1b5x3nkvxOZjXhYWjkBhCRRA4AF6GMOdw2r5ydz7C5GUNJkK_dzbOFFA4NONGWxAnEcLQPk_to_6Br-cPENP24tHMHZS9BwNlHmBHh90-f5eotmmNAWdNAV9aQp60hTA3wkPvDQFlQmcNEH17BU6_fL55OAQt9k2sGRxWGOd5CKiKqSE5rCvVUSY0HChzLgSgJITleYq5DrlKldxHpZaEgCreVmmcOmluiSv0Y5ZGvUGBaDnVZJoqmLJqSIgorFOpUgAK8s8zfgQjboFKmQbit5mRPlZ3MGSIfroB1y4KCx3d83divuO7fbsOkasCG0BfX2TfeEICmWIdjsmFe0uWxWAnwEFJ3C2vb3_LN6hJ9ebYRft1Jdr9R7Qay32GqvPXiNbfwFEJ6FV
linkProvider Geneva Foundation for Medical Education and Research
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Spin-Polarized+Positron+Annihilation+Measurement+on+Ga+Vacancies+in+p-type+GaN&rft.jtitle=E-journal+of+surface+science+and+nanotechnology&rft.au=Maekawa%2C+Masaki&rft.au=Sakai%2C+Seiji&rft.au=Miyashita%2C+Atsumi&rft.au=Kawasuso%2C+Atsuo&rft.date=2018-07-28&rft.issn=1348-0391&rft.eissn=1348-0391&rft.volume=16&rft.spage=347&rft.epage=350&rft_id=info:doi/10.1380%2Fejssnt.2018.347&rft.externalDBID=n%2Fa&rft.externalDocID=10_1380_ejssnt_2018_347
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1348-0391&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1348-0391&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1348-0391&client=summon