TXM-Wizard: a program for advanced data collection and evaluation in full-field transmission X-ray microscopy

Transmission X‐ray microscopy (TXM) has been well recognized as a powerful tool for non‐destructive investigation of the three‐dimensional inner structure of a sample with spatial resolution down to a few tens of nanometers, especially when combined with synchrotron radiation sources. Recent develop...

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Bibliographic Details
Published inJournal of synchrotron radiation Vol. 19; no. 2; pp. 281 - 287
Main Authors Liu, Yijin, Meirer, Florian, Williams, Phillip A., Wang, Junyue, Andrews, Joy C., Pianetta, Piero
Format Journal Article
LanguageEnglish
Published 5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.03.2012
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