TXM-Wizard: a program for advanced data collection and evaluation in full-field transmission X-ray microscopy
Transmission X‐ray microscopy (TXM) has been well recognized as a powerful tool for non‐destructive investigation of the three‐dimensional inner structure of a sample with spatial resolution down to a few tens of nanometers, especially when combined with synchrotron radiation sources. Recent develop...
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Published in | Journal of synchrotron radiation Vol. 19; no. 2; pp. 281 - 287 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
5 Abbey Square, Chester, Cheshire CH1 2HU, England
International Union of Crystallography
01.03.2012
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Subjects | |
Online Access | Get full text |
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