Deep learning-based noise filtering toward millisecond order imaging by using scanning transmission electron microscopy

• Published in: Scientific reports Vol. 12; no. 1; p. 13462
• Main Authors: Ihara, Shiro, Saito, Hikaru, Yoshinaga, Mizumo, Avala, Lavakumar, Murayama, Mitsuhiro
• Format: Journal Article
• Language: English
• Published: London Nature Publishing Group UK 05.08.2022; Nature Publishing Group; Nature Portfolio
• Subjects: 639/301/930/328; 639/301/930/328/2082; Deep learning; External stimuli; Humanities and Social Sciences; multidisciplinary; Science; Science & Technology - Other Topics; Science (multidisciplinary); Transmission electron microscopy

Application of scanning transmission electron microscopy (STEM) to in situ observation will be essential in the current and emerging data-driven materials science by taking STEM’s high affinity with various analytical options into account. As is well known, STEM’s image acquisition time needs to be...