In situ topographical chemical and electrical imaging of carboxyl graphene oxide at the nanoscale
Visualising the distribution of structural defects and functional groups present on the surface of two-dimensional (2D) materials such as graphene oxide challenges the sensitivity and spatial resolution of the most advanced analytical techniques. Here we demonstrate mapping of functional groups on a...
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| Published in | Nature communications Vol. 9; no. 1; pp. 2891 - 7 |
|---|---|
| Main Authors | , , , |
| Format | Journal Article |
| Language | English |
| Published |
London
Nature Publishing Group UK
23.07.2018
Nature Publishing Group Nature Portfolio |
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| Online Access | Get full text |
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| Abstract | Visualising the distribution of structural defects and functional groups present on the surface of two-dimensional (2D) materials such as graphene oxide challenges the sensitivity and spatial resolution of the most advanced analytical techniques. Here we demonstrate mapping of functional groups on a carboxyl-modified graphene oxide (GO–COOH) surface with a spatial resolution of ≈10 nm using tip-enhanced Raman spectroscopy (TERS). Furthermore, we extend the capability of TERS by measuring local electronic properties in situ, in addition to the surface topography and chemical composition. Our results reveal that the Fermi level at the GO–COOH surface decreases as the
I
D
/
I
G
ratio increases, correlating the local defect density with the Fermi level at nanometre length-scales. The in situ multi-parameter microscopy demonstrated in this work significantly improves the accuracy of nanoscale surface characterisation, eliminates measurement artefacts, and opens up the possibilities for characterising optoelectronic devices based on 2D materials under operational conditions.
Mapping the distribution of functional groups on 2D materials with high resolution remains challenging. Here, the authors combine tip-enhanced Raman spectroscopy and Kelvin probe force microscopy to simultaneously examine the topography, chemical composition and electronic nature of graphene oxide surfaces with nanoscale spatial resolution. |
|---|---|
| AbstractList | Visualising the distribution of structural defects and functional groups present on the surface of two-dimensional (2D) materials such as graphene oxide challenges the sensitivity and spatial resolution of the most advanced analytical techniques. Here we demonstrate mapping of functional groups on a carboxyl-modified graphene oxide (GO–COOH) surface with a spatial resolution of ≈10 nm using tip-enhanced Raman spectroscopy (TERS). Furthermore, we extend the capability of TERS by measuring local electronic properties in situ, in addition to the surface topography and chemical composition. Our results reveal that the Fermi level at the GO–COOH surface decreases as the
I
D
/
I
G
ratio increases, correlating the local defect density with the Fermi level at nanometre length-scales. The in situ multi-parameter microscopy demonstrated in this work significantly improves the accuracy of nanoscale surface characterisation, eliminates measurement artefacts, and opens up the possibilities for characterising optoelectronic devices based on 2D materials under operational conditions.
Mapping the distribution of functional groups on 2D materials with high resolution remains challenging. Here, the authors combine tip-enhanced Raman spectroscopy and Kelvin probe force microscopy to simultaneously examine the topography, chemical composition and electronic nature of graphene oxide surfaces with nanoscale spatial resolution. Visualising the distribution of structural defects and functional groups present on the surface of two-dimensional (2D) materials such as graphene oxide challenges the sensitivity and spatial resolution of the most advanced analytical techniques. Here we demonstrate mapping of functional groups on a carboxyl-modified graphene oxide (GO–COOH) surface with a spatial resolution of ≈10 nm using tip-enhanced Raman spectroscopy (TERS). Furthermore, we extend the capability of TERS by measuring local electronic properties in situ, in addition to the surface topography and chemical composition. Our results reveal that the Fermi level at the GO–COOH surface decreases as the I D / I G ratio increases, correlating the local defect density with the Fermi level at nanometre length-scales. The in situ multi-parameter microscopy demonstrated in this work significantly improves the accuracy of nanoscale surface characterisation, eliminates measurement artefacts, and opens up the possibilities for characterising optoelectronic devices based on 2D materials under operational conditions. Visualising the distribution of structural defects and functional groups present on the surface of two-dimensional (2D) materials such as graphene oxide challenges the sensitivity and spatial resolution of the most advanced analytical techniques. Here we demonstrate mapping of functional groups on a carboxyl-modified graphene oxide (GO-COOH) surface with a spatial resolution of ≈10 nm using tip-enhanced Raman spectroscopy (TERS). Furthermore, we extend the capability of TERS by measuring local electronic properties in situ, in addition to the surface topography and chemical composition. Our results reveal that the Fermi level at the GO-COOH surface decreases as the ID/IG ratio increases, correlating the local defect density with the Fermi level at nanometre length-scales. The in situ multi-parameter microscopy demonstrated in this work significantly improves the accuracy of nanoscale surface characterisation, eliminates measurement artefacts, and opens up the possibilities for characterising optoelectronic devices based on 2D materials under operational conditions.Visualising the distribution of structural defects and functional groups present on the surface of two-dimensional (2D) materials such as graphene oxide challenges the sensitivity and spatial resolution of the most advanced analytical techniques. Here we demonstrate mapping of functional groups on a carboxyl-modified graphene oxide (GO-COOH) surface with a spatial resolution of ≈10 nm using tip-enhanced Raman spectroscopy (TERS). Furthermore, we extend the capability of TERS by measuring local electronic properties in situ, in addition to the surface topography and chemical composition. Our results reveal that the Fermi level at the GO-COOH surface decreases as the ID/IG ratio increases, correlating the local defect density with the Fermi level at nanometre length-scales. The in situ multi-parameter microscopy demonstrated in this work significantly improves the accuracy of nanoscale surface characterisation, eliminates measurement artefacts, and opens up the possibilities for characterising optoelectronic devices based on 2D materials under operational conditions. Mapping the distribution of functional groups on 2D materials with high resolution remains challenging. Here, the authors combine tip-enhanced Raman spectroscopy and Kelvin probe force microscopy to simultaneously examine the topography, chemical composition and electronic nature of graphene oxide surfaces with nanoscale spatial resolution. Visualising the distribution of structural defects and functional groups present on the surface of two-dimensional (2D) materials such as graphene oxide challenges the sensitivity and spatial resolution of the most advanced analytical techniques. Here we demonstrate mapping of functional groups on a carboxyl-modified graphene oxide (GO-COOH) surface with a spatial resolution of ≈10 nm using tip-enhanced Raman spectroscopy (TERS). Furthermore, we extend the capability of TERS by measuring local electronic properties in situ, in addition to the surface topography and chemical composition. Our results reveal that the Fermi level at the GO-COOH surface decreases as the I /I ratio increases, correlating the local defect density with the Fermi level at nanometre length-scales. The in situ multi-parameter microscopy demonstrated in this work significantly improves the accuracy of nanoscale surface characterisation, eliminates measurement artefacts, and opens up the possibilities for characterising optoelectronic devices based on 2D materials under operational conditions. Visualising the distribution of structural defects and functional groups present on the surface of two-dimensional (2D) materials such as graphene oxide challenges the sensitivity and spatial resolution of the most advanced analytical techniques. Here we demonstrate mapping of functional groups on a carboxyl-modified graphene oxide (GO–COOH) surface with a spatial resolution of ≈10 nm using tip-enhanced Raman spectroscopy (TERS). Furthermore, we extend the capability of TERS by measuring local electronic properties in situ, in addition to the surface topography and chemical composition. Our results reveal that the Fermi level at the GO–COOH surface decreases as the ID/IG ratio increases, correlating the local defect density with the Fermi level at nanometre length-scales. The in situ multi-parameter microscopy demonstrated in this work significantly improves the accuracy of nanoscale surface characterisation, eliminates measurement artefacts, and opens up the possibilities for characterising optoelectronic devices based on 2D materials under operational conditions. |
| ArticleNumber | 2891 |
| Author | Krayev, Andrey Kumar, Naresh Su, Weitao Chaigneau, Marc |
| Author_xml | – sequence: 1 givenname: Weitao surname: Su fullname: Su, Weitao email: suweitao@hdu.edu.cn organization: College of Materials and Environmental Engineering, Hangzhou Dianzi University, Key Laboratory of RF Circuits and Systems (Hangzhou Dianzi University), Ministry of Education – sequence: 2 givenname: Naresh surname: Kumar fullname: Kumar, Naresh email: naresh.kumar@npl.co.uk organization: National Physical Laboratory, Inorganic Chemistry and Catalysis group, Debye Institute for Nanomaterials Science, Utrecht University – sequence: 3 givenname: Andrey surname: Krayev fullname: Krayev, Andrey organization: HORIBA Instruments Incorporated – sequence: 4 givenname: Marc surname: Chaigneau fullname: Chaigneau, Marc email: Marc.CHAIGNEAU@horiba.com organization: HORIBA France, Avenue de la Vauve, Passage Jobin Yvon |
| BackLink | https://www.ncbi.nlm.nih.gov/pubmed/30038358$$D View this record in MEDLINE/PubMed |
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| Snippet | Visualising the distribution of structural defects and functional groups present on the surface of two-dimensional (2D) materials such as graphene oxide... Mapping the distribution of functional groups on 2D materials with high resolution remains challenging. Here, the authors combine tip-enhanced Raman... |
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| SubjectTerms | 140/133 147/136 639/925/357 639/925/918/1054 639/925/930/527/1821 Artefacts Chemical composition Fermi level Fermi surfaces Functional groups Graphene Humanities and Social Sciences Immunoglobulins multidisciplinary Optoelectronic devices Organic chemistry Raman spectroscopy Science Science (multidisciplinary) Sensitivity analysis Spatial discrimination Spatial resolution Structure-function relationships Surface properties |
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| Title | In situ topographical chemical and electrical imaging of carboxyl graphene oxide at the nanoscale |
| URI | https://link.springer.com/article/10.1038/s41467-018-05307-0 https://www.ncbi.nlm.nih.gov/pubmed/30038358 https://www.proquest.com/docview/2074115488 https://www.proquest.com/docview/2075544052 https://pubmed.ncbi.nlm.nih.gov/PMC6056528 https://doaj.org/article/5761e5f577ac4cc0be1c329980edc1f7 |
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