Atomic resolution electron microscopy in a magnetic field free environment - Shibata, N.; Kohno, Y.; Nakamura, A.; Morishita, S.; Seki, T.; Kumamoto, A.; Sawada, H.; Matsumoto, T.; Findlay, S. D.; Ikuhara, Y. (Nature communications, 2019)
Keywords: 147/137; 147/143; 639/301/119/997; 639/301/930/2735; Electron microscopes; Electron microscopy; Humanities and Social Sciences; Magnetic fields; Magnetic lenses; Magnetic materials; Magnetism; Microscopes; Microscopy; multidisciplinary; Science; Science (multidisciplinary); Silicon steels; Spatial discrimination; Spatial resolution