HEMT太赫兹探测器的二维电子气特性分析

采用分子束外延技术（MBE）对GaAs/AlxGa1-xAs二维电子气（2DEG）样品进行了制备,样品制备过程中,通过改变Al的组分含量、隔离层厚度、对比体掺杂与δ掺杂两种方式,在300 K条件下对制备的样品进行了霍尔测试,获得了室温迁移率7.205E3cm~2/Vs,载流子浓度为1.787E12/cm^3的GaAs/AlxGa1-xAs二维电子气沟道结构,并采用Mathematica软件分别计算了不同沟道宽度时300 K、77 K温度下GaAs基HEMT结构的太赫兹探测响应率,为HEMT场效应管太赫兹探测器的研究和制备提供了参考依据....

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Bibliographic Details
Published in红外与毫米波学报 Vol. 36; no. 6; pp. 790 - 794
Main Author 李金伦;崔少辉;徐建星;袁野;苏向斌;倪海桥;牛智川
Format Journal Article
LanguageChinese
Published 中国人民解放军军械工程学院导弹工程系,河北石家庄050003 2017
中国科学院大学材料科学与光电技术学院,北京100049%西北大学光子学与光子技术研究所,陕西西安710069
中国科学院半导体研究所超晶格实验室,北京100083
中国科学院半导体研究所超晶格实验室,北京100083%中国人民解放军军械工程学院导弹工程系,河北石家庄,050003%中国科学院半导体研究所超晶格实验室,北京100083
Subjects
二维电子气
太赫兹探测器
迁移率
高电子迁移率晶体管
高电子迁移率晶体管
mobility
2DEG
HEMT
THz detector
二维电子气
迁移率
太赫兹探测器
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ISSN1001-9014
DOI10.11972/j.issn.1001-9014.2017.06.025

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Summary:采用分子束外延技术（MBE）对GaAs/AlxGa1-xAs二维电子气（2DEG）样品进行了制备,样品制备过程中,通过改变Al的组分含量、隔离层厚度、对比体掺杂与δ掺杂两种方式,在300 K条件下对制备的样品进行了霍尔测试,获得了室温迁移率7.205E3cm~2/Vs,载流子浓度为1.787E12/cm^3的GaAs/AlxGa1-xAs二维电子气沟道结构,并采用Mathematica软件分别计算了不同沟道宽度时300 K、77 K温度下GaAs基HEMT结构的太赫兹探测响应率,为HEMT场效应管太赫兹探测器的研究和制备提供了参考依据.
Bibliography:The 2DEG samples of GaAs/AlxGa1-xAs was prepared by adopting MBE. In the process of sample preparation,by changing the constituent content of Al and the thickness of the isolation layer and comparing the body doping with the delta doping,we perform the Hall test under the condition of 300 K the migration rate of room temperature is 7. 205 × 103 cm^2/Vs and the carrier concentration is the open groove structure of 2 DEG of GaAs/AlxGa1-xAs,which is 1. 787 × 10^12/cm^3. Besides,the software of Mathematica is adopted to respectively calculate the THz response rates of GaAs-based HEMT structures with different channel widths under the temperature of 300 K and 77 K,which have provided the references for the research and preparation of HEMT THz detectors.
31-1577/TN
HEMT ,2DEG, mobility, THz detector
CUI Shao-Hui1, XU Jian-Xing2,3 ,YUAN Ye2,3, SU Xiang-Bin4,2, NI Hai-Qiao2,3 , NIU Zhi-Chuan2,3 （ 1. Department of Missile Engineering, Ordnance Engineering College, Shijiazhuang 050003, China; 2. State Key Laboratory for S
ISSN:1001-9014
DOI:10.11972/j.issn.1001-9014.2017.06.025