基于分区测试的翻转故障注入方法研究

针对航空器中SRAM型FPGA的单粒子翻转效应故障注入研究越来越重要的趋势,提出基于分区测试的翻转故障注入方法。根据FPGA配置帧的结构特点,对其进行分区测试,分析配置存储器中的敏感位,找到FPGA配置帧中最为敏感的区域。基于动态可重构技术设计了故障注入测试系统,并进行了试验验证。测试结果表明,该方法具有较好的准确率,且能够大大提高翻转故障注入测试的测试效率。...

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Published in电子技术应用 Vol. 43; no. 8; pp. 88 - 91
Main Author 王鹏 张道阳 芦浩 薛茜男
Format Journal Article
LanguageChinese
Published 中国民航大学天津市民用航空器适航与维修重点实验室,天津,300300%中国民航大学天津市民用航空器适航与维修重点实验室,天津300300 2017
中国民航大学安全科学与工程学院,天津300300
Subjects
FPGA
分区测试
故障注入
翻转故障
分区测试
partition test
flip-flop fault
FPGA
fault injection
翻转故障
故障注入
Online AccessGet full text
ISSN0258-7998
DOI10.16157/j.issn.0258-7998.170808

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Summary:针对航空器中SRAM型FPGA的单粒子翻转效应故障注入研究越来越重要的趋势,提出基于分区测试的翻转故障注入方法。根据FPGA配置帧的结构特点,对其进行分区测试,分析配置存储器中的敏感位,找到FPGA配置帧中最为敏感的区域。基于动态可重构技术设计了故障注入测试系统,并进行了试验验证。测试结果表明,该方法具有较好的准确率,且能够大大提高翻转故障注入测试的测试效率。
Bibliography:Wang Peng1, Zhang Daoyang1,2 Lu Hao1, Xue Qiannan1 （1.Tianjin Key Laboratory for Civil Aircraft Airworthiness and Maintenance, Civil Aviation University of China Tianjin 300300, China ; 2.College of Safety Science ＆ Engineering,Civil Aviation University of China,Tianjin 300300,China）
partition test; fault injection; FPGA; flip-flop fault
With the increasingly important trend on fault injection of single event upset for SRAM-based FPGAs in aircraft,a method of flip-flop fault injection based on partition test was proposed.According to the structural characteristics of the FPGA con-figuration frame,partition test is done,the sensitive bits of the configuration memory are analyzed,and the most sensitive area of the FPGA configuration frame is found.This paper designs a test system of fault injection based on dynamic reconfiguration,and verifies it by experiments.The test results show that this method has good accuracy and can greatly improve the efficiency of the flip-flop fault injection test.
11-2305/TN
ISSN:0258-7998
DOI:10.16157/j.issn.0258-7998.170808