Challenges in the size analysis of a silica nanoparticle mixture as candidate certified reference material

A new certified reference material for quality control of nanoparticle size analysis methods has been developed and produced by the Institute for Reference Materials and Measurements of the European Commission’s Joint Research Centre. The material, ERM-FD102, consists of an aqueous suspension of a m...

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Published inJournal of nanoparticle research : an interdisciplinary forum for nanoscale science and technology Vol. 18; no. 6; p. 171
Main Authors Kestens, Vikram, Roebben, Gert, Herrmann, Jan, Jämting, Åsa, Coleman, Victoria, Minelli, Caterina, Clifford, Charles, De Temmerman, Pieter-Jan, Mast, Jan, Junjie, Liu, Babick, Frank, Cölfen, Helmut, Emons, Hendrik
Format Journal Article
LanguageEnglish
Published Dordrecht Springer Netherlands 2016
Springer Nature B.V
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Abstract A new certified reference material for quality control of nanoparticle size analysis methods has been developed and produced by the Institute for Reference Materials and Measurements of the European Commission’s Joint Research Centre. The material, ERM-FD102, consists of an aqueous suspension of a mixture of silica nanoparticle populations of distinct particle size and origin. The characterisation relied on an interlaboratory comparison study in which 30 laboratories of demonstrated competence participated with a variety of techniques for particle size analysis. After scrutinising the received datasets, certified and indicative values for different method-defined equivalent diameters that are specific for dynamic light scattering (DLS), centrifugal liquid sedimentation (CLS), scanning and transmission electron microscopy (SEM and TEM), atomic force microscopy (AFM), particle tracking analysis (PTA) and asymmetrical-flow field-flow fractionation (AF4) were assigned. The value assignment was a particular challenge because metrological concepts were not always interpreted uniformly across all participating laboratories. This paper presents the main elements and results of the ERM-FD102 characterisation study and discusses in particular the key issues of measurand definition and the estimation of measurement uncertainty.
AbstractList A new certified reference material for quality control of nanoparticle size analysis methods has been developed and produced by the Institute for Reference Materials and Measurements of the European Commission's Joint Research Centre. The material, ERM-FD102, consists of an aqueous suspension of a mixture of silica nanoparticle populations of distinct particle size and origin. The characterisation relied on an interlaboratory comparison study in which 30 laboratories of demonstrated competence participated with a variety of techniques for particle size analysis. After scrutinising the received datasets, certified and indicative values for different method-defined equivalent diameters that are specific for dynamic light scattering (DLS), centrifugal liquid sedimentation (CLS), scanning and transmission electron microscopy (SEM and TEM), atomic force microscopy (AFM), particle tracking analysis (PTA) and asymmetrical-flow field-flow fractionation (AF4) were assigned. The value assignment was a particular challenge because metrological concepts were not always interpreted uniformly across all participating laboratories. This paper presents the main elements and results of the ERM-FD102 characterisation study and discusses in particular the key issues of measurand definition and the estimation of measurement uncertainty.
A new certified reference material for quality control of nanoparticle size analysis methods has been developed and produced by the Institute for Reference Materials and Measurements of the European Commission’s Joint Research Centre. The material, ERM-FD102, consists of an aqueous suspension of a mixture of silica nanoparticle populations of distinct particle size and origin. The characterisation relied on an interlaboratory comparison study in which 30 laboratories of demonstrated competence participated with a variety of techniques for particle size analysis. After scrutinising the received datasets, certified and indicative values for different method-defined equivalent diameters that are specific for dynamic light scattering (DLS), centrifugal liquid sedimentation (CLS), scanning and transmission electron microscopy (SEM and TEM), atomic force microscopy (AFM), particle tracking analysis (PTA) and asymmetrical-flow field-flow fractionation (AF4) were assigned. The value assignment was a particular challenge because metrological concepts were not always interpreted uniformly across all participating laboratories. This paper presents the main elements and results of the ERM-FD102 characterisation study and discusses in particular the key issues of measurand definition and the estimation of measurement uncertainty.
ArticleNumber 171
Author Roebben, Gert
Clifford, Charles
Coleman, Victoria
Jämting, Åsa
Babick, Frank
Cölfen, Helmut
Kestens, Vikram
Minelli, Caterina
Mast, Jan
De Temmerman, Pieter-Jan
Junjie, Liu
Emons, Hendrik
Herrmann, Jan
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  surname: Emons
  fullname: Emons, Hendrik
  organization: Institute for Reference Materials and Measurements (IRMM), Joint Research Centre (JRC), European Commission
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Issue 6
Keywords Quality assurance
Measurement uncertainty
Silica nanoparticles
Interlaboratory comparison study
Measurand
Particle size analysis
Certified reference material
Nanotechnology
Language English
License Open AccessThis article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.
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PublicationSubtitle An Interdisciplinary Forum for Nanoscale Science and Technology
PublicationTitle Journal of nanoparticle research : an interdisciplinary forum for nanoscale science and technology
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Springer Nature B.V
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Snippet A new certified reference material for quality control of nanoparticle size analysis methods has been developed and produced by the Institute for Reference...
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StartPage 171
SubjectTerms Characterization and Evaluation of Materials
Chemistry and Materials Science
Fractionation
Inorganic Chemistry
Lasers
Light scattering
Materials Science
Nanoparticles
Nanotechnology
Optical Devices
Optics
Particle size
Photonics
Physical Chemistry
Quality control
Research Paper
Silica
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Title Challenges in the size analysis of a silica nanoparticle mixture as candidate certified reference material
URI https://link.springer.com/article/10.1007/s11051-016-3474-2
https://www.ncbi.nlm.nih.gov/pubmed/27441027
https://www.proquest.com/docview/1798951468
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Volume 18
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