Carbon nanotubes pickup by van der Waals force based on nanorobotics manipulation inside SEM - Yang, Zhan; Chen, Tao; Wang, Yaqiong; Sun, Lining; Fukuda, Toshio (Micro & Nano Letters, 2016)
Keywords: atomic force microscope cantilever; Carbon nanotubes; CNT picking up; contacting models; end effector; End effectors; Mathematical models; nanofabrication; nanorobotic manipulator effector; Nanostructure; Picking; pickup contact area; pickup contact length; probability; Scanning electron microscopy; SEM; Special Issue: Selected Papers from The 11th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems (IEEE-NEMS 2016); Strategy; van der Waals force; Van der Waals forces; scanning electron microscopy; van der Waals force; C; probability; nanofabrication; nanorobotic manipulator effector; contacting models; end effector; carbon nanotubes; pickup contact length; atomic force microscope cantilever; CNT picking up; pickup contact area; SEM