Insights on the Study of Nafion Nanoscale Morphology by Transmission Electron Microscopy

• Published in: Membranes (Basel) Vol. 3; no. 4; pp. 424 - 439
• Main Authors: Yakovlev, Sergey, Balsara, Nitash, Downing, Kenneth
• Format: Journal Article
• Language: English
• Published: Switzerland MDPI AG 16.12.2013; MDPI
• Subjects: electron beam damage; electron microscopy; Energy loss; Irradiation; Low temperature; MATERIALS SCIENCE; Nafion; Neutralization

Nafion is one of the most common materials used for polyelectrolyte membranes and is the standard to which novel materials are compared. In spite of great interest in Nafion’s nanostructure, it is still a subject of controversy. While multiple research efforts have addressed Nafion’s morphology with...