Development of multi-frequency impedance scanning electron microscopy - Ogura, Toshihiko (PloS one, 2022)
Keywords: Auroral kilometric radiation; Biological properties; Biological samples; Biology and Life Sciences; Computer and Information Sciences; Dielectric properties; Electric Impedance; Electrical properties; Electron microscopy; Engineering and Technology; High vacuum; Image resolution; Impedance; Impedance spectroscopy; Innovations; Microscopy, Electron, Scanning; Nanoparticles; Nanotechnology; Nanotubes; Physical Sciences; Radiation; Radiation damage; Research and Analysis Methods; Scanning electron microscopy; Silicon nitride; Sine waves; Specimen Handling; Spheres; Water damage; Japan