Test Method for the Presence or Absence of Pb in Electrical Components Using Energy-Dispersive Micro X-ray Fluorescence

• Published in: Analytical Sciences Vol. 21; no. 7; pp. 869 - 872
• Main Authors: ARAKI, Wakako, MIZOROKI, Kaoru, OKI, Mitsuhiro, TAKENAKA, Miyuki
• Format: Journal Article
• Language: English
• Published: Japan The Japan Society for Analytical Chemistry 2005; Nature Publishing Group
• Subjects: Chemical analysis; Lead - analysis; Mass spectrometry; Quality control; Spectrometry, X-Ray Emission - methods; Thin films; X-ray fluorescence; Zinc Compounds - chemistry

The μ-EDXRF (energy dispersive X-ray fluorescence) method was applied to the screening of Pb in micrometer-area samples, such as a Cu contact in electrical components that had been coated by Pb-free Sn-Ag-Cu solder. The reliability of the screening method was evaluated by a comparison with a scannin...