Risk Factors of Long-Term Sequelae After Transcatheter Closure of Perimembranous Ventricular Septal Defect in Young Children

• Published in: Circulation Journal Vol. 88; no. 5; pp. 663 - 671
• Main Authors: Chiu, Shuenn-Nan, Lin, Hsin-Chia, Lu, Chun-Wei, Fu, Chun-Min, Chin, Chia-Yi, Wang, Jou-Kou, Huang, Shu-Chien, Wu, Mei-Hwan, Chen, Yih-Sharng, Lin, Ming-Tai, Chen, Chun-An, Chou, Heng-Wen, Hsu, Jui-Yu, Chang, Ya-Mei
• Format: Journal Article
• Language: English
• Published: Japan The Japanese Circulation Society 25.04.2024
• Subjects: Age Factors; Aortic regurgitation; Aortic Valve Insufficiency - etiology; Cardiac Catheterization - adverse effects; Child; Child, Preschool; Female; Follow-Up Studies; Heart Septal Defects, Ventricular - surgery; Humans; Male; Postoperative Complications - etiology; Residual shunt; Retrospective Studies; Risk Factors; Septal Occluder Device - adverse effects; Time Factors; Transcatheter closure; Treatment Outcome; Ventricular septal defect; Young children; Young children; Residual shunt; Transcatheter closure; Ventricular septal defect; Aortic regurgitation

Background: Complications arising from transcatheter closure of perimembranous ventricular septal defects (pmVSD) in children, such as residual shunts and aortic regurgitation (AR), have been observed. However, the associated risk factors remain unclear. This study identified risk factors linked wit...