Chemical and elemental mapping of spent nuclear fuel sections by soft X‐ray spectromicroscopy

Soft X‐ray spectromicroscopy at the O K‐edge, U N4,5‐edges and Ce M4,5‐edges has been performed on focused ion beam sections of spent nuclear fuel for the first time, yielding chemical information on the sub‐micrometer scale. To analyze these data, a modification to non‐negative matrix factorization...

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Bibliographic Details
Published inJournal of synchrotron radiation Vol. 29; no. 1; pp. 67 - 79
Main Authors Ditter, Alexander Scott, Smiles, Danil E., Lussier, Daniel, Altman, Alison B., Bachhav, Mukesh, He, Lingfeng, Mara, Michael W., Degueldre, Claude, Minasian, Stefan G., Shuh, David K.
Format Journal Article
LanguageEnglish
Published 5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.01.2022
John Wiley & Sons, Inc
International Union of Crystallography (IUCr)
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