FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST
Multi-cycle Test looks promising a way to reduce the test application time of POST (Power-on Self-Test) for achieving a targeted high fault coverage specified by ISO26262 for testing automotive devices. In this paper, we first analyze the mechanism of Stuck-at Fault Detection Degradation problem in...
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| Published in | IEICE Transactions on Information and Systems Vol. E103.D; no. 11; pp. 2289 - 2301 |
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| Main Authors | , , , , , , , |
| Format | Journal Article |
| Language | English |
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Tokyo
The Institute of Electronics, Information and Communication Engineers
01.11.2020
Japan Science and Technology Agency |
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| Abstract | Multi-cycle Test looks promising a way to reduce the test application time of POST (Power-on Self-Test) for achieving a targeted high fault coverage specified by ISO26262 for testing automotive devices. In this paper, we first analyze the mechanism of Stuck-at Fault Detection Degradation problem in multi-cycle test. Based on the result of our analysis we propose a novel solution named FF-Control Point Insertion technique (FF-CPI) to achieve the reduction of scan-in patterns by multi-cycle test. The FF-CPI technique modifies the captured values of scan Flip-Flops (FFs) during capture operation by directly reversing the value of partial FFs or loading random vectors. The FF-CPI technique enhances the number of detectable stuck-at faults under the capture patterns. The experimental results of ISCAS89 and ITC99 benchmarks validated the effectiveness of FF-CPI technique in scan-in pattern reduction for POST. |
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| AbstractList | Multi-cycle Test looks promising a way to reduce the test application time of POST (Power-on Self-Test) for achieving a targeted high fault coverage specified by ISO26262 for testing automotive devices. In this paper, we first analyze the mechanism of Stuck-at Fault Detection Degradation problem in multi-cycle test. Based on the result of our analysis we propose a novel solution named FF-Control Point Insertion technique (FF-CPI) to achieve the reduction of scan-in patterns by multi-cycle test. The FF-CPI technique modifies the captured values of scan Flip-Flops (FFs) during capture operation by directly reversing the value of partial FFs or loading random vectors. The FF-CPI technique enhances the number of detectable stuck-at faults under the capture patterns. The experimental results of ISCAS89 and ITC99 benchmarks validated the effectiveness of FF-CPI technique in scan-in pattern reduction for POST. |
| Author | AONO, Tomoki MAEDA, Yoichi IWATA, Hiroyuki HIGAMI, Yoshinobu Al-AWADHI, Hanan T. TAKAHASHI, Hiroshi MATSUSHIMA, Jun WANG, Senling |
| Author_xml | – sequence: 1 fullname: Al-AWADHI, Hanan T. organization: Dept. of Computer Science, Ehime University – sequence: 2 fullname: AONO, Tomoki organization: Dept. of Computer Science, Ehime University – sequence: 3 fullname: WANG, Senling organization: Dept. of Computer Science, Ehime University – sequence: 4 fullname: HIGAMI, Yoshinobu organization: Dept. of Computer Science, Ehime University – sequence: 5 fullname: TAKAHASHI, Hiroshi organization: Dept. of Computer Science, Ehime University – sequence: 6 fullname: IWATA, Hiroyuki organization: Renesas Electronics Corporation – sequence: 7 fullname: MAEDA, Yoichi organization: Renesas Electronics Corporation – sequence: 8 fullname: MATSUSHIMA, Jun organization: Renesas Electronics Corporation |
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| SubjectTerms | BIST Degradation Fault detection Fault detection degradation FF selection FF-Control Point Insertion technique Insertion Multi-Cycle Test POST Reduction Self tests |
| Title | FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST |
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