FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST

• Published in: IEICE Transactions on Information and Systems Vol. E103.D; no. 11; pp. 2289 - 2301
• Main Authors: Al-AWADHI, Hanan T., AONO, Tomoki, WANG, Senling, HIGAMI, Yoshinobu, TAKAHASHI, Hiroshi, IWATA, Hiroyuki, MAEDA, Yoichi, MATSUSHIMA, Jun
• Format: Journal Article
• Language: English
• Published: Tokyo The Institute of Electronics, Information and Communication Engineers 01.11.2020; Japan Science and Technology Agency
• Subjects: BIST; Degradation; Fault detection; Fault detection degradation; FF selection; FF-Control Point Insertion technique; Insertion; Multi-Cycle Test; POST; Reduction; Self tests
• ISSN: 0916-8532; 1745-1361
• DOI: 10.1587/transinf.2019EDP7235

Multi-cycle Test looks promising a way to reduce the test application time of POST (Power-on Self-Test) for achieving a targeted high fault coverage specified by ISO26262 for testing automotive devices. In this paper, we first analyze the mechanism of Stuck-at Fault Detection Degradation problem in multi-cycle test. Based on the result of our analysis we propose a novel solution named FF-Control Point Insertion technique (FF-CPI) to achieve the reduction of scan-in patterns by multi-cycle test. The FF-CPI technique modifies the captured values of scan Flip-Flops (FFs) during capture operation by directly reversing the value of partial FFs or loading random vectors. The FF-CPI technique enhances the number of detectable stuck-at faults under the capture patterns. The experimental results of ISCAS89 and ITC99 benchmarks validated the effectiveness of FF-CPI technique in scan-in pattern reduction for POST.