快电子对快离子损失诊断测量的影响

基于闪烁体原理的快离子损失探针（Fast Ion Loss Detector,FILD）,可以同时测量损失快离子的能量和pitch-angle的值,是核聚变装置中对高能粒子诊断的重要方式。根据先进实验超导托卡马克（Experimental Advanced Superconducting Tokamak,EAST）的发展需求,为了更好地对损失快离子行为进行研究,设计并安装了快离子损失诊断,且探测到在中性束加热条件下产生的损失快离子。同时,探测到在放电中产生的逃逸电子,以及低杂波注入时快电子产生X射线对快离子损失背景信号的影响。并且在H-mode放电时边界扰动也对快离子损失信号产生影响,这些探测...

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Bibliographic Details
Published in核技术 Vol. 40; no. 11; pp. 85 - 90
Main Author 金钊 常加峰 黄娟 吴承瑞 林士耀
Format Journal Article
LanguageChinese
Published 中国科学院等离子体物理研究所 合肥 230031 2017
中国科学技术大学 合肥 230026%中国科学院等离子体物理研究所 合肥 230031
Subjects
快离子损失诊断
逃逸电子
闪烁体
逃逸电子
Scintillator
FILD
快离子损失诊断
Runaway electrons
闪烁体
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ISSN0253-3219
DOI10.11889/j.0253-3219.2017.hjs.40.110605

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Summary:基于闪烁体原理的快离子损失探针（Fast Ion Loss Detector,FILD）,可以同时测量损失快离子的能量和pitch-angle的值,是核聚变装置中对高能粒子诊断的重要方式。根据先进实验超导托卡马克（Experimental Advanced Superconducting Tokamak,EAST）的发展需求,为了更好地对损失快离子行为进行研究,设计并安装了快离子损失诊断,且探测到在中性束加热条件下产生的损失快离子。同时,探测到在放电中产生的逃逸电子,以及低杂波注入时快电子产生X射线对快离子损失背景信号的影响。并且在H-mode放电时边界扰动也对快离子损失信号产生影响,这些探测到的现象都为不断升级损失诊断系统提供依据。
Bibliography:Scintillator, FILD, Runaway electrons
31-1342/TL
Background： A scintillator-based fast ion loss detector （FILD） can simultaneously measure the energy and pitch angle of escaped fast ions, which is a powerful method to study the behavior of fast ion feature. Purpose： Investigating the performance of the fast ion loss is very helpful for understanding plasma confinement due to the development of experimental advanced superconducting tokamak （EAST）. Methods： FILD has been successfully put into operation on EAST, and the behavior of fast ion can be analyzed by charge coupled device （CCD） and photomultiplier tube （PMT） data acquisition system. Results： When the neutral beams were injected, the fast ion losses were detected. Runaway electrons and the fast electrons were observed when lower hybrid waves were injected into plasma, resulting in the effect of X-rays on the fast ion loss signal. In H-mode discharge condition, the fast ion losses signal changed with D-alpha signals. Conclusion： Fast ion loss detector syste
ISSN:0253-3219
DOI:10.11889/j.0253-3219.2017.hjs.40.110605