Atomically resolved imaging of radiation-sensitive metal-organic frameworks via electron ptychography

• Published in: Nature communications Vol. 16; no. 1; pp. 914 - 8
• Main Authors: Li, Guanxing, Xu, Ming, Tang, Wen-Qi, Liu, Ying, Chen, Cailing, Zhang, Daliang, Liu, Lingmei, Ning, Shoucong, Zhang, Hui, Gu, Zhi-Yuan, Lai, Zhiping, Muller, David A., Han, Yu
• Format: Journal Article
• Language: English
• Published: London Nature Publishing Group UK 22.01.2025; Nature Publishing Group; Nature Portfolio
• Subjects: 147/143; 639/301/930/2735; 639/638/911; 639/925/357/404; Data acquisition; Datasets; Effectiveness; Electron beams; Electrons; Humanities and Social Sciences; Image acquisition; Image reconstruction; Image resolution; Metal clusters; Metal-organic frameworks; Metals; Microscopy; multidisciplinary; Parameter identification; Parameter sensitivity; Porous materials; Radiation; Radiation dosage; Science; Science (multidisciplinary)

Electron ptychography, recognized as an ideal technique for low-dose imaging, consistently achieves deep sub-angstrom resolution at electron doses of several thousand electrons per square angstrom (e − /Å 2 ) or higher. Despite its proven efficacy, the application of electron ptychography at even lo...