Joint strength and interfacial microstructure between Sn–Ag–Cu and Sn–Zn–Bi solders and Cu substrate
In the present research, in order to fundamentally investigate the strength and interfacial microstructure of the joints between Sn–3.5Ag–0.7Cu (SAC) and Sn–8Zn–3Bi (SZB) solders and Cu, examinations using the standardized solder joint specimen for measuring the shear strength were performed. The ef...
Saved in:
Published in | Science and technology of advanced materials Vol. 5; no. 1; pp. 267 - 276 |
---|---|
Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Elsevier Ltd
01.01.2004
Taylor & Francis IOP Publishing |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | In the present research, in order to fundamentally investigate the strength and interfacial microstructure of the joints between Sn–3.5Ag–0.7Cu (SAC) and Sn–8Zn–3Bi (SZB) solders and Cu, examinations using the standardized solder joint specimen for measuring the shear strength were performed. The effects of the addition of Ag, Bi and Pb to the solders, which are the ingredients of possible lead plating materials of quad plat package, solder layer thickness and aging treatments ranging from 358 to 423 K were investigated. The SAC base solder joints, whose strength hardly degraded after aging, were more reliable than the SZB base solder joints. Since no detrimental effect of the Bi or Pb addition was recognized, the lead plating materials are found to have no significant effect on the strength of the SAC solder joints. Although the SZB base solder joints had higher strength than the SAC base solder joints in as-soldered condition, a significant degradation of the joint strength occurred after aging. In the case of thinner solder layer of 20 μm, the Cu
6Sn
5 layer that formed at both the solder/Cu
5Zn
8 and Cu
5Zn
8/Cu interfaces after aging caused the fracture of the solder joints and resulted in the degradation of the joint strength. In the case of thicker solder layer of 100 μm, the Cu
5Zn
8 interfacial layer continuously grew during aging, which caused the fracture of the solder joints and resulted in the decrease in the joint strength. As for the effect of the addition elements, while Pb addition caused a marked degradation of the joint strength, Ag addition and Bi addition had no detrimental effect on the strength of the solder joints. In particular, the joint with the Ag addition solder had the better strength in the case of thinner solder layer. Thus, as for lead plating for the SZB solder, Sn–Pb should be avoided and Sn–Bi or Sn–Ag as Pb-free plating has no detrimental effect on the joint strength. In particular, Sn–Ag plating is preferable in the viewpoint of the joint strength. |
---|---|
AbstractList | In the present research, in order to fundamentally investigate the strength and interfacial microstructure of the joints between Sn-3.5Ag-0.7Cu (SAC) and Sn-8Zn-3Bi (SZB) solders and Cu, examinations using the standardized solder joint specimen for measuring the shear strength were performed. The effects of the addition of Ag, Bi and Pb to the solders, which are the ingredients of possible lead plating materials of quad plat package, solder layer thickness and aging treatments ranging from 358 to 423 K were investigated. The SAC base solder joints, whose strength hardly degraded after aging, were more reliable than the SZB base solder joints. Since no detrimental effect of the Bi or Pb addition was recognized, the lead plating materials are found to have no significant effect on the strength of the SAC solder joints. Although the SZB base solder joints had higher strength than the SAC base solder joints in as-soldered condition, a significant degradation of the joint strength occurred after aging. In the case of thinner solder layer of 20 μm, the Cu
6
Sn
5
layer that formed at both the solder/Cu
5
Zn
8
and Cu
5
Zn
8
/Cu interfaces after aging caused the fracture of the solder joints and resulted in the degradation of the joint strength. In the case of thicker solder layer of 100 μm, the Cu
5
Zn
8
interfacial layer continuously grew during aging, which caused the fracture of the solder joints and resulted in the decrease in the joint strength. As for the effect of the addition elements, while Pb addition caused a marked degradation of the joint strength, Ag addition and Bi addition had no detrimental effect on the strength of the solder joints. In particular, the joint with the Ag addition solder had the better strength in the case of thinner solder layer. Thus, as for lead plating for the SZB solder, Sn-Pb should be avoided and Sn-Bi or Sn-Ag as Pb-free plating has no detrimental effect on the joint strength. In particular, Sn-Ag plating is preferable in the viewpoint of the joint strength. In the present research, in order to fundamentally investigate the strength and interfacial microstructure of the joints between Sn–3.5Ag–0.7Cu (SAC) and Sn–8Zn–3Bi (SZB) solders and Cu, examinations using the standardized solder joint specimen for measuring the shear strength were performed. The effects of the addition of Ag, Bi and Pb to the solders, which are the ingredients of possible lead plating materials of quad plat package, solder layer thickness and aging treatments ranging from 358 to 423 K were investigated. The SAC base solder joints, whose strength hardly degraded after aging, were more reliable than the SZB base solder joints. Since no detrimental effect of the Bi or Pb addition was recognized, the lead plating materials are found to have no significant effect on the strength of the SAC solder joints. Although the SZB base solder joints had higher strength than the SAC base solder joints in as-soldered condition, a significant degradation of the joint strength occurred after aging. In the case of thinner solder layer of 20 μm, the Cu 6Sn 5 layer that formed at both the solder/Cu 5Zn 8 and Cu 5Zn 8/Cu interfaces after aging caused the fracture of the solder joints and resulted in the degradation of the joint strength. In the case of thicker solder layer of 100 μm, the Cu 5Zn 8 interfacial layer continuously grew during aging, which caused the fracture of the solder joints and resulted in the decrease in the joint strength. As for the effect of the addition elements, while Pb addition caused a marked degradation of the joint strength, Ag addition and Bi addition had no detrimental effect on the strength of the solder joints. In particular, the joint with the Ag addition solder had the better strength in the case of thinner solder layer. Thus, as for lead plating for the SZB solder, Sn–Pb should be avoided and Sn–Bi or Sn–Ag as Pb-free plating has no detrimental effect on the joint strength. In particular, Sn–Ag plating is preferable in the viewpoint of the joint strength. |
Author | Kobayashi, Kojiro F Ide, Eiichi Hirose, Akio Yanagawa, Hiroto |
Author_xml | – sequence: 1 givenname: Akio surname: Hirose fullname: Hirose, Akio email: hirose@mapse.eng.osaka-u.ac.jp – sequence: 2 givenname: Hiroto surname: Yanagawa fullname: Yanagawa, Hiroto – sequence: 3 givenname: Eiichi surname: Ide fullname: Ide, Eiichi – sequence: 4 givenname: Kojiro F surname: Kobayashi fullname: Kobayashi, Kojiro F |
BookMark | eNp9kE2OEzEQhS00IzE_XIBVr5E6lLttp1uCRYiAAY3EAtiwsfxTHhx17Mh2GM2OO3BDTjLuZCQ2KJuy69V7Zeu7JGchBiTkJYUFBSpebxa5qO2iA-irsICOPSMXdFgOLeeUndU7E0MrxlE8J5c5bwBA0I5dkOlz9KE0uSQMd-Vno4JtqoDJKePV1Gy9SbFO96bsEzYayz1iaL6Gv7__rO5qWe8PmYPwYy7vfJPjZDHlw6DO817XDargNTl3asr44um8It8_vP-2vmlvv3z8tF7dtob3vLRs1NQaPjjtGIolswyg9iCWpldjL0AJwS3TQzdq5pYIGjrkXHMmQKOG_op0x73z33NCJ3fJb1V6kBTkzEtu5MxLzrxmrfKqoVfHkI-7f_6KTc7YJJdUdnLVD3JnXTW3_zGfWv72yR9cTFt1H9NkZVEPU0wuqWB8lv3J_JtjHiu2Xx6TzMZjMGh9QlOkjf7U84-RDKuv |
CitedBy_id | crossref_primary_10_1007_s11664_017_5384_1 crossref_primary_10_1016_j_jallcom_2007_05_029 crossref_primary_10_1016_j_jallcom_2006_07_035 crossref_primary_10_1080_10420150500335363 crossref_primary_10_1016_j_jmrt_2022_05_067 crossref_primary_10_1088_2058_8585_ac264f crossref_primary_10_4028_www_scientific_net_KEM_353_358_2928 crossref_primary_10_1016_j_jestch_2018_10_002 crossref_primary_10_1351_pac200779101755 crossref_primary_10_1007_s11664_017_5763_7 crossref_primary_10_4236_eng_2018_101003 crossref_primary_10_1016_j_jmatprotec_2007_04_072 crossref_primary_10_1016_j_msea_2006_07_100 crossref_primary_10_3139_146_101012 crossref_primary_10_1016_j_jallcom_2005_08_034 crossref_primary_10_1016_j_mtcomm_2023_106350 crossref_primary_10_1007_s11664_020_08693_8 crossref_primary_10_1557_jmr_2006_0198 crossref_primary_10_1155_2014_606814 crossref_primary_10_2320_matertrans_47_211 crossref_primary_10_1007_s11664_022_09732_2 crossref_primary_10_2478_v10172_011_0149_y crossref_primary_10_1016_j_microrel_2007_10_005 crossref_primary_10_1108_SSMT_02_2024_0006 crossref_primary_10_1007_s11664_016_4574_6 crossref_primary_10_1007_s10854_023_10075_9 crossref_primary_10_1007_s11664_005_0204_4 crossref_primary_10_1016_j_jallcom_2008_05_082 crossref_primary_10_1007_s10853_012_6624_7 crossref_primary_10_1016_j_jcrysgro_2005_12_090 crossref_primary_10_1007_s12666_015_0517_9 crossref_primary_10_1016_j_tca_2013_06_039 crossref_primary_10_1007_s10854_009_9877_4 crossref_primary_10_1016_j_jallcom_2013_08_022 crossref_primary_10_1007_s10854_006_9078_3 crossref_primary_10_1016_j_msea_2006_10_163 crossref_primary_10_1088_1468_6996_16_3_033505 crossref_primary_10_1557_JMR_2005_0155 crossref_primary_10_2320_matertrans_M2012136 |
Cites_doi | 10.5104/jiep.6.503 10.1557/JMR.1998.0391 10.1016/S0927-796X(00)00010-3 10.1007/s11664-003-0127-x 10.2320/matertrans.42.756 10.2320/matertrans.42.794 10.1557/mrs2001.228 10.2207/qjjws.17.484 10.2472/jsms.40.77 10.2320/matertrans.43.1833 |
ContentType | Journal Article |
Copyright | 2003 Elsevier Ltd 2004 Elsevier Science Ltd 2004 |
Copyright_xml | – notice: 2003 Elsevier Ltd – notice: 2004 Elsevier Science Ltd 2004 |
DBID | AAYXX CITATION |
DOI | 10.1016/j.stam.2003.10.024 |
DatabaseName | CrossRef |
DatabaseTitle | CrossRef |
DatabaseTitleList | |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISSN | 1878-5514 |
EndPage | 276 |
ExternalDocumentID | 10_1016_j_stam_2003_10_024 11660185 S1468699603001359 |
Genre | Original Articles |
GroupedDBID | --K 02O 0R~ 0YH 123 1B1 1JI 1WK 1~5 2WC 4.4 4G. 5VS 7-5 8G5 AAEDT AAGCD AALHV AALRI AAQFI AAQXK AATNI AAXUO ABUWG ACAFW ACBEA ACGFO ACGFS ADBBV ADCVX ADDVE ADMUD AEFHF AEJGL AENEX AFKRA AFYNE AHSEE AIAGR AIYBF ALMA_UNASSIGNED_HOLDINGS AOIJS ASPBG ATQHT AVWKF AZFZN AZQEC BBWZM BCNDV BENPR BPHCQ C1A CCPQU CS3 DU5 DWQXO E3Z EBS EDWGO EJD EO8 EQZZN FDB FEDTE FGOYB G-Q GNUQQ GROUPED_DOAJ GUQSH HH5 HVGLF HYE HZ~ IHE IJHAN IOP IPNFZ JCGBZ KNG KOT KQ8 M2O M45 M48 M4Z N5L NQ- NT- O3W O9- OK1 P2P PJBAE PQQKQ PROAC Q02 R2- RDKPK RIG RIN RNS ROL RPA RPM RPZ S3P SDP SEW SY9 T37 TDBHL TFMNY TFW TR2 UCJ UHS W28 XPP 1PV AAPBV 0R 53G ABHWH ABNOP ADKZR AFRUD AQIPR CJUJL HZ K LI0 UNR AAYXX CITATION H13 |
ID | FETCH-LOGICAL-c535t-49b1dc58fbf4e674d400dc5067c3a9360a665d4b829b4f7e0b02e55b5460beb03 |
IEDL.DBID | M48 |
ISSN | 1468-6996 |
IngestDate | Fri Aug 23 00:26:21 EDT 2024 Tue Nov 10 14:22:16 EST 2020 Mon May 13 14:22:24 EDT 2019 Tue Jun 13 19:28:44 EDT 2023 Wed Aug 14 03:47:58 EDT 2024 |
IsDoiOpenAccess | false |
IsOpenAccess | true |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 1 |
Keywords | Lead plating Aging treatment Intermetallic compound layer Interfacial reaction Reflow-soldering Sn–Zn–Bi solder Pb-free solders Sn–Ag–Cu solder Joint strength |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c535t-49b1dc58fbf4e674d400dc5067c3a9360a665d4b829b4f7e0b02e55b5460beb03 |
OpenAccessLink | https://doi.org/10.1016/j.stam.2003.10.024 |
PageCount | 10 |
ParticipantIDs | iop_primary_10_1016_j_stam_2003_10_024 elsevier_sciencedirect_doi_10_1016_j_stam_2003_10_024 informaworld_taylorfrancis_310_1016_j_stam_2003_10_024 crossref_primary_10_1016_j_stam_2003_10_024 |
PublicationCentury | 2000 |
PublicationDate | 2004-01-01 |
PublicationDateYYYYMMDD | 2004-01-01 |
PublicationDate_xml | – month: 01 year: 2004 text: 2004-01-01 day: 01 |
PublicationDecade | 2000 |
PublicationTitle | Science and technology of advanced materials |
PublicationYear | 2004 |
Publisher | Elsevier Ltd Taylor & Francis IOP Publishing |
Publisher_xml | – name: Elsevier Ltd – name: Taylor & Francis – name: IOP Publishing |
References | Abtew, Selvadurary (BIB1) 2000; R27 Hirose, Fujii, Imamura, Kobayashi (BIB3) 2001; 42 Test methods for lead-free solders—Part 5: methods for tensile tests and shear tests on solder joints, JIS Z 3198–5. Uenishi, Kohara, Sakatani, Kobayashi, Yamamoto (BIB5) 2002; 43 Villars, Prince, Okamoto (BIB10) 1995 Yanagawa, Imamura, Ide, Hirose, Kobayashi, Japan (BIB11) 2003; 6 Hiramori, Ito, Yoshikawa, Hirose, Kobayashi (BIB6) 2003; 6 Suganuma, Niihara, Shoutoku, Nakamura (BIB9) 1998; 13 Uenishi, Saeki, Kohara, Kobayashi, Shoji, Nishiura, Yamamoto (BIB4) 2001; 42 Suganuma (BIB2) 2001; 26 Kuroda, Saida, Nishimoto (BIB13) 1999; 17 Hirose, Matsuhiro, Kotoh, Kobayashi (BIB12) 1991; 40 Iwanihsi, Imamura, Hirose, Tateyama, Mori, Kobayashi (BIB7) 2003; 32 T Hiramori (6) 2003; 6 H Yanagawa (11) 2003; 6 K Suganuma (2) 2001; 26 1 P Villars (10) 1995 3 4 S Kuroda (13) 1999; 17 5 7 8 9 A Hirose (12) 1991; 40 |
References_xml | – volume: 43 start-page: 1833 year: 2002 end-page: 1839 ident: BIB5 publication-title: Mater. Trans. contributor: fullname: Yamamoto – volume: 42 start-page: 794 year: 2001 end-page: 802 ident: BIB3 publication-title: Mater. Trans. contributor: fullname: Kobayashi – volume: 40 start-page: 77 year: 1991 end-page: 88 ident: BIB12 publication-title: J. Soc. Mater. Sci. Japan contributor: fullname: Kobayashi – volume: R27 start-page: 95 year: 2000 end-page: 141 ident: BIB1 publication-title: Mater. Sci. Engng contributor: fullname: Selvadurary – volume: 13 start-page: 2859 year: 1998 end-page: 2865 ident: BIB9 publication-title: J. Mater. Res. contributor: fullname: Nakamura – volume: 6 start-page: 47 year: 2003 end-page: 53 ident: BIB11 publication-title: Inst. Electron. Packaging contributor: fullname: Japan – volume: 26 start-page: 880 year: 2001 end-page: 884 ident: BIB2 publication-title: MRS Bull. contributor: fullname: Suganuma – volume: 6 start-page: 503 year: 2003 end-page: 508 ident: BIB6 publication-title: J. Japan Inst. Electron. Packaging contributor: fullname: Kobayashi – year: 1995 ident: BIB10 article-title: Handbook of Ternary Alloy Phase Diagrams contributor: fullname: Okamoto – volume: 42 start-page: 756 year: 2001 end-page: 760 ident: BIB4 publication-title: Mater. Trans. contributor: fullname: Yamamoto – volume: 32 start-page: 1540 year: 2003 end-page: 1546 ident: BIB7 publication-title: J. Electron. Mater. contributor: fullname: Kobayashi – volume: 17 start-page: 484 year: 1999 end-page: 489 ident: BIB13 publication-title: Q. J. Japan Welding Soc. contributor: fullname: Nishimoto – volume: 6 start-page: 503 issn: 1343-9677 year: 2003 ident: 6 publication-title: J. Japan Inst. Electron. Packaging doi: 10.5104/jiep.6.503 contributor: fullname: T Hiramori – ident: 9 doi: 10.1557/JMR.1998.0391 – volume: 6 start-page: 47 issn: 1343-9677 year: 2003 ident: 11 publication-title: J. Japan Inst. Electron. Packaging contributor: fullname: H Yanagawa – ident: 1 doi: 10.1016/S0927-796X(00)00010-3 – ident: 7 doi: 10.1007/s11664-003-0127-x – ident: 4 doi: 10.2320/matertrans.42.756 – year: 1995 ident: 10 publication-title: Handbook of Ternary Alloy Phase Diagrams contributor: fullname: P Villars – ident: 3 doi: 10.2320/matertrans.42.794 – volume: 26 start-page: 880 issn: 0883-7694 year: 2001 ident: 2 publication-title: MRS Bull. doi: 10.1557/mrs2001.228 contributor: fullname: K Suganuma – volume: 17 start-page: 484 issn: 0288-4771 year: 1999 ident: 13 publication-title: Q. J. Japan Welding Soc. doi: 10.2207/qjjws.17.484 contributor: fullname: S Kuroda – volume: 40 start-page: 77 issn: 0514-5163 year: 1991 ident: 12 publication-title: J. Soc. Mater. Sci. Japan doi: 10.2472/jsms.40.77 contributor: fullname: A Hirose – ident: 5 doi: 10.2320/matertrans.43.1833 – ident: 8 |
SSID | ssj0006124 |
Score | 1.9340571 |
Snippet | In the present research, in order to fundamentally investigate the strength and interfacial microstructure of the joints between Sn–3.5Ag–0.7Cu (SAC) and... In the present research, in order to fundamentally investigate the strength and interfacial microstructure of the joints between Sn-3.5Ag-0.7Cu (SAC) and... |
SourceID | crossref iop informaworld elsevier |
SourceType | Aggregation Database Enrichment Source Publisher |
StartPage | 267 |
SubjectTerms | Aging treatment Interfacial reaction Intermetallic compound layer Joint strength Lead plating Pb-free solders Reflow-soldering Sn-Ag-Cu solder Sn-Zn-Bi solder |
SummonAdditionalLinks | – databaseName: Institute of Physics (IOP) Publishing Journals dbid: IOP link: http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3LSsQwFA3iShe-xTcBxY10ps1r2uU4OIjgA1QQN6FpUx0fnWHsbFz5D_6hX-K9TasjoswmtHmUtCfNvSTn3BCylwQc7E7APBFKSDI_9uJIRF6iEtwVszIqRWKnZ-r4WpzcyJtvsXqvP6hm_gZcup181AYpcMubshl4rNnmKO1FATDK9c4vvuZdsNWi1hJh_Uoi49hc4GqVunPeQC4XE3-ZoR_xSsHeQC_G7E13npzVqh1HM3lsjArTSF5_B3Gc7FUWyFzledK2GyqLZMrmS2R2LB7hMnk66ffygqJ-JL8r7mmcpxTjSQyzGFfW6TOy91zE2dHQ0orjRS_zj7f39h0knVHZpsy4xeSwR2FwI1m6LIDyF5ipyoi4K-S6e3TVOfaq4xi8RHJZeCIyQZrIMDOZsKolUvj94R7MXcLjiCs_VkqmwoQsMiJrWd_4zEpppFC-scbnq2Q67-d2jVCM-c6Yn7DUWMEMC4OWFWkYySxUkZFsnRzU6OiBi7qhazrag0Ys8fhMjnmA5TqRNYC6-uTOH9BgFv5tp8bR1kW5RpK5A000_6_hPkA6Uc92f1QE_DXir6UONNOAvx6k2cakj9skM444hCtAW2Qa8Lbb4BMVZqf8FT4BTvcG4w priority: 102 providerName: IOP Publishing – databaseName: Taylor & Francis Open Access Journals dbid: 0YH link: http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1bS8MwFA46X_RBvOK8EVB8kWibW9vHORxjoC86mL6Epk3mBLuxdf_fk150Ax3iSyFpUtKck3ynp-d8Qegy8Rngjk8JDwVcrBeTOOIRSWTi_ooZERVJYg-PstvnvYEYVA63WRVW6b6hbUkUUezVbnHHenb7HZsFhlORRc5uXGQW5etogwYA_aDP3kv3aycG9OZ1dpEEw75Kmvn5Gb8B0xKDKSDQaDxZQKDODtquTEfcKmW9i9ZMtoe2FggF91HaG4-yHLsEkGyYv2F4RewIIaY2dq5x_OHC70rK2PnU4CpICz9lpDUk7XnRHgqvGbkbYdBKF-VcVMK9GWwxBZXtAep37p_bXVKdo0ASwUROeKT9NBGh1ZYbGfAU1i2UAacSFkdMerGUIuU6pJHmNjCe9qgRQgsuPW20xw5RIxtn5ghhR9ZOqZfQVBtONQ39wPA0jIQNZaQFbaLrehLVpKTLUHUc2btyU-7OvWSuDqa8iUQ9z6oC_BLIFYh8ZT-5KBSVF84NW55Eotiqjlcgvj-N7GKpIWiQchqkhPIVVS0Wqklqj_87jhO0WUYAOVfOKWqA3M0ZGDe5Pi80-BMPCfJH priority: 102 providerName: Taylor & Francis |
Title | Joint strength and interfacial microstructure between Sn–Ag–Cu and Sn–Zn–Bi solders and Cu substrate |
URI | https://dx.doi.org/10.1016/j.stam.2003.10.024 https://www.tandfonline.com/doi/abs/10.1016/j.stam.2003.10.024 http://iopscience.iop.org/1468-6996/5/1-2/A38 |
Volume | 5 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1LS8NAEF5qvehBfOKzLCheJJLsq8lBpIpSCz5AC-plySYbrWhaawp68z_4D_0lzm4S2oKKeBlINhuWmdnM7GTmG4S2Io-C3fGIw3wOJHFDJwxY4EQiMn_FNA9skdjpmWi2WeuaX1dQ2e6oYODLt0c700-q3X_cfX1-24cNvzfM1QJHylaV012TqUXYBJokDE7qJpWPDdHDwZqzstpIgKNfFNF8_46fDNUYoilYpE63N2KRjmfRTOFK4kYu-zlU0ek8mh4BGFxAj61uJ82wKQhJ77J7HKYxNgAR_SQ0oXL8ZNLxcgjZQV_jImkLX6af7x-NOyCHAzvH3rg15KCDQVtN9rMdgPEX-PRYiNtF1D4-ujpsOkV_BSfilGcOC5QXR9xPVMK0qLMY9jNcg_2KaBhQ4YZC8JgpnwSKJXXtKpdozhVnwlVauXQJVdNuqpcRNiDuhLgRiZVmRBHfq2sW-wFPfBEoTlbQTslM2cthNGSZX_YgDetNP0xq7gHrVxAv-S0LRyA38BLE_us8MSocmdmgR5J3KJH0t4nbIMY_rWxz7EHQJGk0SXLpSSIb1Je9OFn95_rX0FSeGGQiPOuoCuLXG-DzZKqGJtybZs1GDICenF_UrGp_AX2_Aow |
link.rule.ids | 315,783,787,867,1560,2228,24330,27514,27936,27937,53918,59471,59472 |
linkProvider | Scholars Portal |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1LS8QwEA4-DupBfOLbgOJFom1e2xxXUdbnRQX1Epo20RXsLlr_vzNtV1dQES-FpElJZyb5ptN5ELKdxQJwJ-ZMJgouIUpZaqRhmc7wr5hXpgoSu7jUnRt5eqtumzqnr41bJX5DhzpRRHVW4-ZGY_T-p3MWaE5VGLnYQ9csLkfJuDKyhSUMorvOx1EM8C0H4UUaNPsmaub7Z_yETF9SmAIEdXv9IQg6niHTje5I2zWzZ8mIL-bI1FBGwXmSn_a6RUkxAqR4KB8pvCPFjBAvIUXbOH1G_7s6Z-zbi6eNlxa9Klj7gR2-VeOhcV-wgy4FsUQ356oT7r3CGVPlsl0gN8dH14cd1hRSYJkSqmTSuDjPVBJckF63ZA4bF9oAVJlIjdBRqrXKpUu4cTK0fOQi7pVySurIeReJRTJW9Aq_RChma-c8ynjuvOSOJ3HLyzwxKiTaOMWXye6AiLZf58uwA0eyJ4skx8KXAvuA5MtEDehsG8SvkdwCz3-dp4eZYsvKuhHqUiRW_DZxB9j3p5VtfRkIEmRRgqyyseW2LRLbz8PKf9exSSY61xfn9vzk8myVTNbuQGjXWSNjIAN-HTSd0m1U0vwOMvX1tw |
linkToPdf | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV1LT9wwELYKlRA9tDzFq9QSqBeU3cSvjY_bhRVQoEiAhLhYceIABbKrbfbCif_AP-SXdGwnZUEFIXGxEjtjOZ6JZ-R88xmh9TSi4HciErCYQ5GHSZBIJoNUpPavmOHSJYntH4jtE7Z7yms0ocuF6fWrpb8Bl54o2E9h8xGaBXGTSyKnDQvMIqzZz_Ix9JFTGVlU186vw3-LMThwVicYCYjtq7yZ__fzkm96QmIKTghGNuKEul-QrofvsSdXjWGpG-ntM2bHd73fFPpchai47QWm0QdTzKBPI8SFs-h6t3dZlNgmmhTn5QVOigxb4olBntgteHxjYX6emnY4MLgCg-Gj4uHuvn0ORWfoZFzFmS1-XGL4Ciyq2jVA-x9Y0hx17hw66W4dd7aD6tyGIOWUlwGTOspSHuc6Z0a0WAbrBNyDX0xpIqkIEyF4xnRMpGZ5y4Q6JIZzzZkItdEhnUfjRa8wCwhbcnhCwpRk2jCiSRy1DMtiyfNYSM3JItqoNab6np5D1bi138rOoz1nk9o6mMdFxGulqkoLPnBQ4D9elROjFqBKt5mS-5NPFH1N8Dto-U0jW3vyIJirsuaquIoUUW0aK7CBpbd29w1NHG521d7Owc9lNOnBRnbXaAWNg-rNV4ijSr3qvpS_AmAYMA |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Joint+strength+and+interfacial+microstructure+between+Sn%E2%80%93Ag%E2%80%93Cu+and+Sn%E2%80%93Zn%E2%80%93Bi+solders+and+Cu+substrate&rft.jtitle=Science+and+technology+of+advanced+materials&rft.au=Hirose%2C+Akio&rft.au=Yanagawa%2C+Hiroto&rft.au=Ide%2C+Eiichi&rft.au=Kobayashi%2C+Kojiro+F&rft.date=2004-01-01&rft.pub=Elsevier+Ltd&rft.issn=1468-6996&rft.volume=5&rft.issue=1&rft.spage=267&rft.epage=276&rft_id=info:doi/10.1016%2Fj.stam.2003.10.024&rft.externalDocID=S1468699603001359 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1468-6996&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1468-6996&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1468-6996&client=summon |