Surface structures of binary mixtures of imidazolium-based ionic liquids using high-resolution Rutherford backscattering spectroscopy and time of flight secondary ion mass spectroscopy
Surface structures of binary mixtures of imidazolium-based ionic liquids having a common anion (bis(trifluoromethanesulfonyl)imide ([TFSI]), namely [C2MIM]1-x[C10MIM]x[TFSI] (x = 0.5 and 0.1), are studied using high-resolution Rutherford backscattering spectroscopy (HRBS) and time of flight secondar...
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Published in | The Journal of chemical physics Vol. 139; no. 22; p. 224701 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
United States
14.12.2013
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Abstract | Surface structures of binary mixtures of imidazolium-based ionic liquids having a common anion (bis(trifluoromethanesulfonyl)imide ([TFSI]), namely [C2MIM]1-x[C10MIM]x[TFSI] (x = 0.5 and 0.1), are studied using high-resolution Rutherford backscattering spectroscopy (HRBS) and time of flight secondary ion mass spectroscopy (TOF-SIMS). Although both measurements show surface segregation of [C10MIM] the degrees of the segregation are different. The surface fraction xsurf of [C10MIM] is estimated to be 0.6 ± 0.05 and 0.18 ± 0.02 by HRBS for x = 0.5 and 0.1, respectively. On the other hand, TOF-SIMS indicates much stronger surface segregation, namely xsurf = 0.83 ± 0.03 and 0.42 ± 0.04 for x = 0.5 and 0.1, respectively. The observed discrepancy can be attributed to the difference in the probing depth between HRBS and TOF-SIMS. The observed surface segregation can be roughly explained in terms of surface tension. |
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AbstractList | Surface structures of binary mixtures of imidazolium-based ionic liquids having a common anion (bis(trifluoromethanesulfonyl)imide ([TFSI]), namely [C2MIM]1-x[C10MIM]x[TFSI] (x = 0.5 and 0.1), are studied using high-resolution Rutherford backscattering spectroscopy (HRBS) and time of flight secondary ion mass spectroscopy (TOF-SIMS). Although both measurements show surface segregation of [C10MIM] the degrees of the segregation are different. The surface fraction xsurf of [C10MIM] is estimated to be 0.6 ± 0.05 and 0.18 ± 0.02 by HRBS for x = 0.5 and 0.1, respectively. On the other hand, TOF-SIMS indicates much stronger surface segregation, namely xsurf = 0.83 ± 0.03 and 0.42 ± 0.04 for x = 0.5 and 0.1, respectively. The observed discrepancy can be attributed to the difference in the probing depth between HRBS and TOF-SIMS. The observed surface segregation can be roughly explained in terms of surface tension. |
Author | Suzuki, Motofumi Kimura, Kenji Miyashita, Motoki Nakajima, Kaoru |
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BackLink | https://www.ncbi.nlm.nih.gov/pubmed/24329076$$D View this record in MEDLINE/PubMed |
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